Inventor · disambiguated record
Yiping Hsiao
Also filed as: HSIAO YIPING
17 granted patents·1 pending application·442 citations·filing 1994–2009
95Inventor score
Top patents by PatentIndex Score
18 records- 0189US6515826B1Magnetic head induction coil fabrication method utilizing aspect ratio dependent etchingIBM·Filed 2000·Granted Feb 4, 2003·24 cites·12 claims
- 0287US6001235ARotary plater with radially distributed plating solutionIBM·Filed 1997·Granted Dec 14, 1999·136 cites·20 claims
- 0385US6913704B2Magnetic head induction coil fabrication method utilizing aspect ratio dependent etchingHITACHI GLOBAL STORAGE TECH·Filed 2002·Granted Jul 5, 2005·16 cites·6 claims
- 0482US6503406B1Method for forming the air bearing surface of a slider using nonreactive plasmaIBM·Filed 2000·Granted Jan 7, 2003·17 cites·5 claims
- 0582US6416935B1Method for forming the air bearing surface of a sliderIBM·Filed 2000·Granted Jul 9, 2002·17 cites·8 claims
- 0677US7137190B2Method for fabricating a magnetic transducer with a corrosion resistant layer on metallic thin films by nitrogen exposureHITACHI GLOBAL STORAGE TECH·Filed 2002·Granted Nov 21, 2006·11 cites·5 claims
- 0776US5788801AReal time measurement of etch rate during a chemical etching processIBM·Filed 1997·Granted Aug 4, 1998·49 cites·6 claims
- 0871US7339763B2Disk drive thin-film inductive write head with pole tip structure having reduced susceptibility to corrosionHITACHI GLOBAL STORAGE TECH·Filed 2005·Granted Mar 4, 2008·2 cites·3 claims
- 0970US6589436B1Method of adjusting the flatness of a slider using selective plasma etchingIBM·Filed 2000·Granted Jul 8, 2003·15 cites·14 claims
- 1066US5516399AContactless real-time in-situ monitoring of a chemical etchingIBM·Filed 1994·Granted May 14, 1996·40 cites·18 claims
- 1165US6512382B1Method for corrosion susceptibility testing of magnetic heads using simulated disk corrosion productsIBM·Filed 2001·Granted Jan 28, 2003·5 cites·7 claims
- 1265US5501766AMinimizing overetch during a chemical etching processIBM·Filed 1994·Granted Mar 26, 1996·26 cites·15 claims
- 1356US5573624AChemical etch monitor for measuring film etching uniformity during a chemical etching processIBM·Filed 1994·Granted Nov 12, 1996·26 cites·10 claims
- 1453US5582746AReal time measurement of etch rate during a chemical etching processIBM·Filed 1994·Granted Dec 10, 1996·19 cites·11 claims
- 1553US5500073AReal time measurement of etch rate during a chemical etching processIBM·Filed 1995·Granted Mar 19, 1996·15 cites·15 claims
- 1650US6804878B1Method of improving the reliability of magnetic head sensors by ion milling smoothingHITACHI GLOBAL STORAGE TECH·Filed 1999·Granted Oct 19, 2004·9 cites·13 claims
- 1750US2011058279A1Overcoat having a low silicon/carbon ratioFLINT ERIC·Filed 2009·Application pending·0 cites
- 1846US5489361AMeasuring film etching uniformity during a chemical etching processIBM·Filed 1994·Granted Feb 6, 1996·15 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →