Inventor · disambiguated record
Yin Hu
Also filed as: HU YIN · Hu yin-liang
10 granted patents·5 pending applications·137 citations·filing 1997–2025
85Inventor score
Top patents by PatentIndex Score
15 records- 0186US5936278ASemiconductor on silicon (SOI) transistor with a halo implantTEXAS INSTRUMENTS INC·Filed 1997·Granted Aug 10, 1999·75 cites·6 claims
- 0278US5909628AReducing non-uniformity in a refill layer thickness for a semiconductor deviceTEXAS INSTRUMENTS INC·Filed 1997·Granted Jun 1, 1999·54 cites·31 claims
- 0364US12455410B2Ring-shaped light guide module and light emitting devicePRIMAX ELECTRONICS LTD·Filed 2023·Granted Oct 28, 2025·0 cites·9 claims
- 0456US12340823B2Accelerated video editingIBM·Filed 2023·Granted Jun 24, 2025·0 cites·20 claims
- 0554US2025224011A1Device for suppressing low-frequency line spectrum vibrationUNIV HARBIN ENG·Filed 2025·Application pending·0 cites
- 0652US2025288472A1Pant type absorbent articlePROCTER & GAMBLE·Filed 2025·Application pending·0 cites
- 0749US2025254186A1Confidence-based event group management, workflow exploitation and anomaly detectionIBM·Filed 2024·Application pending·0 cites
- 0848US2024112410A1Learned feature prioritization to reduce image display noiseIBM·Filed 2022·Application pending·0 cites
- 0945US2012084246A1Decision-making method, decision-making system, and policy decision functionZHOU QING·Filed 2011·Application pending·0 cites
- 1042US11746968B1Miniature backlight kitPRIMAX ELECTRONICS LTD·Filed 2023·Granted Sep 5, 2023·0 cites·10 claims
- 1132US6207500B1DRAM chip fabrication methodTEXAS INSTRUMENTS INC·Filed 1998·Granted Mar 27, 2001·3 cites·9 claims
- 1230US5910017AIncreasing uniformity in a refill layer thickness for a semiconductor deviceTEXAS INSTRUMENTS INC·Filed 1997·Granted Jun 8, 1999·4 cites·8 claims
- 1329US6562724B1Self-aligned stack formationTEXAS INSTRUMENTS INC·Filed 1998·Granted May 13, 2003·1 cites·7 claims
- 1428US6232644B1Oxide profile modification by reactant shuntingTEXAS INSTRUMENTS INC·Filed 1999·Granted May 15, 2001·0 cites·14 claims
- 1528US6083809AOxide profile modification by reactant shuntingTEXAS INSTRUMENTS INC·Filed 1997·Granted Jul 4, 2000·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →