Inventor · disambiguated record
Yin-Chao Hwang
Also filed as: HWANG YIN-CHAO
4 granted patents·356 citations·filing 1985–1989
83Inventor score
Technology areasG01R
Files withTEXAS INSTRUMENTS INC4
Top patents by PatentIndex Score
4 records- 0193US4701921AModularized scan path for serially tested logic circuitTEXAS INSTRUMENTS INC·Filed 1985·Granted Oct 20, 1987·113 cites·16 claims
- 0293US4698588ATransparent shift register latch for isolating peripheral ports during scan testing of a logic circuitTEXAS INSTRUMENTS INC·Filed 1985·Granted Oct 6, 1987·108 cites·11 claims
- 0391US4710933AParallel/serial scan system for testing logic circuitsTEXAS INSTRUMENTS INC·Filed 1985·Granted Dec 1, 1987·77 cites·15 claims
- 0487US5032783ATest circuit and scan tested logic device with isolated data lines during testingTEXAS INSTRUMENTS INC·Filed 1989·Granted Jul 16, 1991·58 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →