Inventor · disambiguated record
Yi-An Lai
Also filed as: LAI YI-AN
12 granted patents·22 pending applications·35 citations·filing 2006–2025
86Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD28QUANTA COMP INC2CHIC TECHNOLOGY CORP1LAI YI-AN1TAIWAN SEMICONDUCTOR MFG CO LID1
Top patents by PatentIndex Score
34 records- 0187US11764760B1Pulse width control apparatus and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Sep 19, 2023·1 cites·20 claims
- 0285US2025323638A1Semiconductor Devices And Circuits With Increased Breakdown VoltageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0383US12216152B2Gallium nitride-based devices and methods of testing thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Feb 4, 2025·0 cites·20 claims
- 0483US2025286539A1Pulse Width Control Apparatus and MethodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0583US2025336908A1HETEROGENOUS INTEGRATION SCHEME FOR III-V/Si AND Si CMOS INTEGRATED CIRCUITSTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0682US9164551B2Tablet computerQUANTA COMP INC·Filed 2013·Granted Oct 20, 2015·7 cites·9 claims
- 0781US2025366177A1Driving circuit, and method of operating driving circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 0880US12407343B2Semiconductor devices and circuits with increased breakdown voltageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Granted Sep 2, 2025·0 cites·20 claims
- 0980US2025138084A1Gallium nitride-based devices and methods of testing thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1078US12334925B2Pulse width control apparatus and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Jun 17, 2025·0 cites·20 claims
- 1178US2024387501A1HETEROGENOUS INTEGRATION SCHEME FOR III-V/Si AND Si CMOS INTEGRATED CIRCUITSTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1277US8265317B2Electronic deviceTSENG CHEN·Filed 2010·Granted Sep 11, 2012·6 cites·10 claims
- 1377US2025329590A1Quality Detection Method and ApparatusTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 1476US11852675B2Gallium nitride-based devices and methods of testing thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Dec 26, 2023·0 cites·20 claims
- 1575US2024387300A1Manufacturing method of group iii-v semiconductor packageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1675US2025349612A1Selective metal cap in an interconnect structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 1773US2025159976A1Driving circuit, precharging circuitry for driving circuit, and method of operating driving circuitTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 1873US2025349611A1Low contact resistance vias in backend interconnect structuresTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 1973US2025331272A1Quasi field-plate structure for semiconductor devicesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 2072US12355024B2Heterogenous integration scheme for III-V/Si and Si CMOS integrated circuitsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jul 8, 2025·0 cites·20 claims
- 2172US11955956B2Semiconductor devices and circuits with increased breakdown voltageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Apr 9, 2024·0 cites·20 claims
- 2271USD541275SPeripheral receiver of computerCHIC TECHNOLOGY CORP·Filed 2006·Granted Apr 24, 2007·21 cites·1 claims
- 2368US2025087533A1Low contact resistance vias in backend interconnect structuresTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 2467US12400918B2Quality detection method and apparatusTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Aug 26, 2025·0 cites·20 claims
- 2566US2024363697A1Quasi field-plate structure for semiconductor devicesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 2663US2022336295A1Manufacturing method of group iii-v semiconductor packageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Application pending·0 cites
- 2760US2025370027A1Apparatus and method for stress testing transistorsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 2859US2025339242A1Gallium nitride-based devices and methods of testing thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2025·Application pending·0 cites
- 2956US12451398B2Gallium nitride-based devices and methods of testing thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Oct 21, 2025·0 cites·20 claims
- 3055US2023395694A1Gallium nitride high electron mobility transistorTAIWAN SEMICONDUCTOR MFG CO LID·Filed 2023·Application pending·0 cites
- 3154US2025063824A1Electrostatic discharge protection deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 3254US2024421194A1Gallium nitride device with artificial field platesTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 3345US2013020337A1Container sealLAI YI-AN·Filed 2011·Application pending·0 cites
- 3444US2009085868A1Composite notebookQUANTA COMP INC·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →