Inventor · disambiguated record
Yin Long
Also filed as: LONG YIN
9 granted patents·6 pending applications·43 citations·filing 2007–2023
80Inventor score
Files withSHANGHAI HUALI MICROELECT CORP6SHANGHAI HUALI INTEGRATED CIRCUIT CORP2BEIJING ZITIAO NETWORK TECHNOLOGY CO LTD1Baidu online network technology beijing co ltd1HUAWEI TECH CO LTD1
Top patents by PatentIndex Score
15 records- 0191US8865482B2Method of detecting the circular uniformity of the semiconductor circular contact holesSHANGHAI HUALI MICROELECT CORP·Filed 2013·Granted Oct 21, 2014·37 cites·6 claims
- 0277US11344719B2Electric bandage for accelerated wound recoveryWISCONSIN ALUMNI RES FOUND·Filed 2019·Granted May 31, 2022·4 cites·19 claims
- 0362US9269639B2Method of detecting and measuring contact alignment shift relative to gate structures in a semicondcutor deviceSHANGHAI HUALI MICROELECT CORP·Filed 2013·Granted Feb 23, 2016·2 cites·11 claims
- 0450US12198061B2Method and apparatus for predicting yield of semiconductor devicesSHANGHAI HUALI INTEGRATED CIRCUIT CORP·Filed 2021·Granted Jan 14, 2025·0 cites·19 claims
- 0548US2024362354A1Native database tenant lifecycle managementSAP SE·Filed 2023·Application pending·0 cites
- 0641US2024163500A1Information display method, apparatus, electronic device and storage mediumBEIJING ZITIAO NETWORK TECHNOLOGY CO LTD·Filed 2023·Application pending·0 cites
- 0741US2020213838A1Method and Apparatus for Communication Authentication Processing, and Electronic DeviceBaidu online network technology beijing co ltd·Filed 2019·Application pending·0 cites
- 0840US8658438B2Measurement of lateral diffusion of implanted ions in doped well region of semiconductor devicesSHANGHAI HUALI MICROELECT CORP·Filed 2012·Granted Feb 25, 2014·0 cites·8 claims
- 0938US11307151B2Method for detecting wafer backside defectSHANGHAI HUALI INTEGRATED CIRCUIT CORP·Filed 2020·Granted Apr 19, 2022·0 cites·14 claims
- 1038US8987013B2Method of inspecting misalignment of polysilicon gateSHANGHAI HUALI MICROELECT CORP·Filed 2013·Granted Mar 24, 2015·0 cites·6 claims
- 1138US2013138239A1Semiconductor yield management systemSHANGHAI HUALI MICROELECT CORP·Filed 2012·Application pending·0 cites
- 1237US11687488B2Directory deletion method and apparatus, and storage serverHUAWEI TECH CO LTD·Filed 2019·Granted Jun 27, 2023·0 cites·20 claims
- 1336US2008124891A1Method for Preventing Wafer Edge Peeling in Metal Wiring ProcessSEMICONDUCTOR MFG INT SHANGHAI·Filed 2007·Application pending·0 cites
- 1435US2013137196A1Method for monitoring devices in semiconductor processSHANGHAI HUALI MICROELECT CORP·Filed 2012·Application pending·0 cites
- 1527US9080863B2Method for monitoring alignment between contact holes and polycrystalline silicon gateSHANGAI HUALI MICROELECTRONICS CORP·Filed 2012·Granted Jul 14, 2015·0 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →