Inventor · disambiguated record
Ying Shiau
Also filed as: SHIAU YING
13 granted patents·1,142 citations·filing 1995–1999
95Inventor score
Files withADVANCED MICRO DEVICES INC13
Top patents by PatentIndex Score
13 records- 0195US5761064ADefect management system for productivity and yield improvementADVANCED MICRO DEVICES INC·Filed 1995·Granted Jun 2, 1998·243 cites·40 claims
- 0294US5787190AMethod and apparatus for pattern recognition of wafer test binsADVANCED MICRO DEVICES INC·Filed 1997·Granted Jul 28, 1998·230 cites·3 claims
- 0394US5726920AWatchdog system having data differentiating means for use in monitoring of semiconductor wafer testing lineADVANCED MICRO DEVICES INC·Filed 1995·Granted Mar 10, 1998·158 cites·47 claims
- 0493US5896294AMethod and apparatus for inspecting manufactured products for defects in response to in-situ monitoringADVANCED MICRO DEVICES INC·Filed 1997·Granted Apr 20, 1999·145 cites·19 claims
- 0588US5930138AArrangement and method for detecting sequential processing effects in manufacturing using predetermined sequences within runsADVANCED MICRO DEVICES INC·Filed 1997·Granted Jul 27, 1999·85 cites·7 claims
- 0683US5598341AReal-time in-line defect disposition and yield forecasting systemADVANCED MICRO DEVICES INC·Filed 1995·Granted Jan 28, 1997·82 cites·17 claims
- 0780US5761065AArrangement and method for detecting sequential processing effects in manufacturingADVANCED MICRO DEVICES INC·Filed 1995·Granted Jun 2, 1998·61 cites·28 claims
- 0875US6001663AApparatus for detecting defect sizes in polysilicon and source-drain semiconductor devices and method for making the sameADVANCED MICRO DEVICES INC·Filed 1999·Granted Dec 14, 1999·46 cites·6 claims
- 0970US5822717AMethod and apparatus for automated wafer level testing and reliability data analysisADVANCED MICRO DEVICES INC·Filed 1995·Granted Oct 13, 1998·34 cites·10 claims
- 1061US5821765AApparatus for detecting defect sizes in polysilicon and source-drain semiconductor devices and method for making the sameADVANCED MICRO DEVICES INC·Filed 1997·Granted Oct 13, 1998·20 cites·8 claims
- 1156US5670891AStructures to extract defect size information of poly and source-drain semiconductor devices and method for making the sameADVANCED MICRO DEVICES INC·Filed 1995·Granted Sep 23, 1997·16 cites·18 claims
- 1254US5716856AArrangement and method for detecting sequential processing effects in manufacturing using predetermined sequences within runsADVANCED MICRO DEVICES INC·Filed 1995·Granted Feb 10, 1998·17 cites·9 claims
- 1338US5963780AMethod for detecting defect sizes in polysilicon and source-drain semiconductor devicesADVANCED MICRO DEVICES INC·Filed 1997·Granted Oct 5, 1999·5 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →