Inventor · disambiguated record
Yih-Hsing Wang
Also filed as: WANG YIH-HSING
2 granted patents·3 pending applications·8 citations·filing 2002–2016
46Inventor score
Files withCHUNG SHAN INST OF SCIENCE2NAT CHUNG SHAN INST SCIENCE & TECH2NAT CHUNG SHAN INST OF SCIENCE AND TECH1
Top patents by PatentIndex Score
5 records- 0149US6685543B2Compensating chemical mechanical wafer polishing apparatus and methodCHUNG SHAN INST OF SCIENCE·Filed 2002·Granted Feb 3, 2004·8 cites·10 claims
- 0233US2018127875A1Apparatus for performing selenization and sulfurization process on glass substrateNAT CHUNG SHAN INST SCIENCE & TECH·Filed 2016·Application pending·0 cites
- 0329US9983080B2High-temperature gas pressure measuring methodNAT CHUNG SHAN INST SCIENCE & TECH·Filed 2015·Granted May 29, 2018·0 cites·9 claims
- 0428US2004259481A1Method of polishing semiconductor copper interconnect integrated with extremely low dielectric constant materialCHUNG SHAN INST OF SCIENCE·Filed 2003·Application pending·0 cites
- 0520US2017155005A1Selenization/sulfurization process apparatus for use with single-piece glass substrateNAT CHUNG SHAN INST OF SCIENCE AND TECH·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →