Inventor · disambiguated record
Ying-Ying Wang
Also filed as: WANG YING-YING
23 granted patents·4 pending applications·234 citations·filing 1999–2020
93Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD11CHANG HSIN-PEI8TAIWAN SEMICONDUCTOR MFG4LEE YUNG-YAO2CHEN WEN-RONG1
Top patents by PatentIndex Score
27 records- 0195US6514672B2Dry development process for a bi-layer resist systemTAIWAN SEMICONDUCTOR MFG·Filed 2001·Granted Feb 4, 2003·113 cites·13 claims
- 0294US8703368B2Lithography processLEE YUNG-YAO·Filed 2012·Granted Apr 22, 2014·14 cites·20 claims
- 0388US6174818B1Method of patterning narrow gate electrodeTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Jan 16, 2001·77 cites·15 claims
- 0479US8860941B2Tool induced shift reduction determination for overlay metrologyLEE YUNG-YAO·Filed 2012·Granted Oct 14, 2014·3 cites·19 claims
- 0579US8614000B2Coated article and method of making the sameCHANG HSIN-PEI·Filed 2011·Granted Dec 24, 2013·1 cites·6 claims
- 0677US9646896B2Lithographic overlay samplingTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted May 9, 2017·4 cites·20 claims
- 0776US9176396B2Overlay sampling methodologyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Nov 3, 2015·3 cites·20 claims
- 0871US10831110B2Lithographic overlay correction and lithographic processTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Nov 10, 2020·1 cites·19 claims
- 0968US9766559B2Edge-dominant alignment method in exposure scanner systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Sep 19, 2017·1 cites·17 claims
- 1067US9659128B2Semiconductor overlay production system and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted May 23, 2017·1 cites·19 claims
- 1165US9772561B2Semiconductor manufacturing method and toolTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Sep 26, 2017·1 cites·20 claims
- 1262US9164398B2Overlay metrology methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Oct 20, 2015·1 cites·20 claims
- 1362US8741444B2Process for surface treating iron-based alloy and articleCHANG HSIN-PEI·Filed 2011·Granted Jun 3, 2014·0 cites·8 claims
- 1461US8637862B2Device housing and method for making the sameCHANG HSIN-PEI·Filed 2011·Granted Jan 28, 2014·0 cites·7 claims
- 1561US8637148B2Coated article and method of making the sameCHANG HSIN-PEI·Filed 2011·Granted Jan 28, 2014·0 cites·7 claims
- 1661US8609241B2Coated article and method of making the sameCHANG HSIN-PEI·Filed 2011·Granted Dec 17, 2013·0 cites·6 claims
- 1760US9104831B2Semiconductor overlay production system and methodTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted Aug 11, 2015·1 cites·20 claims
- 1859US11966170B2Lithographic overlay correction and lithographic processTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Apr 23, 2024·0 cites·20 claims
- 1953US9927719B2Overlay sampling methodologyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Mar 27, 2018·0 cites·20 claims
- 2053US6255022B1Dry development process for a bi-layer resist system utilized to reduce microloadingTAIWAN SEMICONDUCTOR MFG·Filed 1999·Granted Jul 3, 2001·13 cites·20 claims
- 2152US9563946B2Overlay metrology method and overlay control method and systemTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Feb 7, 2017·0 cites·20 claims
- 2250US2012276413A1Process for surface treating iron-based alloy and articleCHANG HSIN-PEI·Filed 2011·Application pending·0 cites
- 2350US2012276407A1Process for surface treating iron-based alloy and articleCHANG HSIN-PEI·Filed 2011·Application pending·0 cites
- 2449US2012090868A1Housing and method for making the sameCHANG HSIN-PEI·Filed 2011·Application pending·0 cites
- 2541US8822019B2Coated article and method for making sameCHEN WEN-RONG·Filed 2011·Granted Sep 2, 2014·0 cites·14 claims
- 2638US2012315501A1Coated article and method for making sameCHIANG HUANN-WU·Filed 2011·Application pending·0 cites
- 2735US9646902B2Paired edge alignmentTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted May 9, 2017·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →