Inventor · disambiguated record
Yi Wei
Also filed as: WEI YI · WEI YI-JIN
10 granted patents·2 pending applications·317 citations·filing 1999–2022
90Inventor score
Top patents by PatentIndex Score
12 records- 0196US6596187B2Method of forming a nano-supported sponge catalyst on a substrate for nanotube growthMOTOROLA INC·Filed 2001·Granted Jul 22, 2003·153 cites·30 claims
- 0294US6891319B2Field emission display and methods of forming a field emission displayMOTOROLA INC·Filed 2001·Granted May 10, 2005·65 cites·15 claims
- 0380US6916717B2Method for growing a monocrystalline oxide layer and for fabricating a semiconductor device on a monocrystalline substrateMOTOROLA INC·Filed 2002·Granted Jul 12, 2005·27 cites·25 claims
- 0478US7070472B2Field emission display and methods of forming a field emission displayMOTOROLA INC·Filed 2004·Granted Jul 4, 2006·27 cites·25 claims
- 0575US6353286B1Field emission display having a multi-layered barrier structureMOTOROLA INC·Filed 1999·Granted Mar 5, 2002·26 cites·20 claims
- 0667US6920680B2Method of making vacuum microelectronic deviceMOTOROLA INC·Filed 2001·Granted Jul 26, 2005·7 cites·7 claims
- 0762US7501750B2Emitting device having electron emitting nanostructures and method of operationMOTOROLA INC·Filed 2005·Granted Mar 10, 2009·1 cites·20 claims
- 0861US7431964B2Method of forming a porous metal catalyst on a substrate for nanotube growthMOTOROLA INC·Filed 2004·Granted Oct 7, 2008·4 cites·24 claims
- 0956US6693033B2Method of removing an amorphous oxide from a monocrystalline surfaceMOTOROLA INC·Filed 2001·Granted Feb 17, 2004·6 cites·29 claims
- 1049US2023128736A1Method for testing light-emitting diode, and a plasma generating device for implementing the methodUNIV MING CHI TECHNOLOGY·Filed 2022·Application pending·0 cites
- 1145US6806202B2Method of removing silicon oxide from a surface of a substrateMOTOROLA INC·Filed 2002·Granted Oct 19, 2004·1 cites·3 claims
- 1240US2008310185A1Addressable lighting element for a mobile communication deviceMOTOROLA INC·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →