Inventor · disambiguated record
Yi-Jen Wu
Also filed as: WU YI · WU YI-JEN
17 granted patents·8 pending applications·115 citations·filing 1999–2025
91Inventor score
Files withHOUZZ INC4AU OPTRONICS CORP3NOVATEK MICROELECTRONICS CORP3PHROZEN TECH CO LTD3ACTHERM INC2
Top patents by PatentIndex Score
25 records- 0193US10475250B1Virtual item simulation using detected surfacesHOUZZ INC·Filed 2018·Granted Nov 12, 2019·32 cites·20 claims
- 0293US7557507B2Electrode and method of manufactureAU OPTRONICS CORP·Filed 2004·Granted Jul 7, 2009·57 cites·6 claims
- 0384US11164384B2Mobile device image item replacementsHOUZZ INC·Filed 2019·Granted Nov 2, 2021·4 cites·20 claims
- 0473US2024392109A1Manufacturing method of low-shrinkage photocurable materialPHROZEN TECH CO LTD·Filed 2024·Application pending·0 cites
- 0572US7964370B2Analytical strip and detecting method using the sameACTHERM INC·Filed 2008·Granted Jun 21, 2011·3 cites·20 claims
- 0666US9773147B1Fingerprint enrollment method and apparatus using the sameNOVATEK MICROELECTRONICS CORP·Filed 2016·Granted Sep 26, 2017·2 cites·24 claims
- 0764US2022157028A1Mobile device image item replacementsHOUZZ INC·Filed 2021·Application pending·0 cites
- 0863US10630919B2Image sensing apparatus and black level correction method thereof and computer readable mediumNOVATEK MICROELECTRONICS CORP·Filed 2018·Granted Apr 21, 2020·1 cites·19 claims
- 0961US2021371625A1Low-shrinkage photocurable material and manufacturing method thereofPHROZEN TECH CO LTD·Filed 2021·Application pending·0 cites
- 1058US12462554B2Fingerprint recognition device and fingerprint recognition methodREALTEK SEMICONDUCTOR CORP·Filed 2025·Granted Nov 4, 2025·0 cites·16 claims
- 1158US10909768B2Virtual item simulation using detected surfacesHOUZZ INC·Filed 2019·Granted Feb 2, 2021·0 cites·20 claims
- 1258USD774393SBox insertTAIWAN FU HSING IND CO LTD·Filed 2015·Granted Dec 20, 2016·8 cites·1 claims
- 1351US11856300B2Method for detecting interference patterns for under-screen camera, compensation method and circuit systemREALTEK SEMICONDUCTOR CORP·Filed 2022·Granted Dec 26, 2023·0 cites·20 claims
- 1451US8372660B2Quantitative analyzing methodACTHERM INC·Filed 2009·Granted Feb 12, 2013·0 cites·11 claims
- 1550US11931960B23D printer assembly and illumination module thereofPHROZEN TECH CO LTD·Filed 2021·Granted Mar 19, 2024·0 cites·10 claims
- 1649US7042547B2Method of repairing pit defect and salient defect of electrode patternAU OPTRONICS CORP·Filed 2003·Granted May 9, 2006·1 cites·9 claims
- 1749US2010285991A1Combinatory analytical stripGLAXOSMITHKLINE LLC·Filed 2008·Application pending·0 cites
- 1847US2011318822A1Analytical stripHSIEH CHIH-WEI·Filed 2008·Application pending·0 cites
- 1944US8133718B2Analytical strip and detecting method using the sameWU YI-JEN·Filed 2009·Granted Mar 13, 2012·0 cites·20 claims
- 2043US2011243811A1Substrate of analytical stripHSIEH WEN-PIN·Filed 2008·Application pending·0 cites
- 2140US2005259037A1Alternating current plasma display panelAU OPTRONICS CORP·Filed 2005·Application pending·0 cites
- 2239US8980215B2Method for preparing ultrafine tungsten carbide powderWEI BAIWAN·Filed 2009·Granted Mar 17, 2015·0 cites·5 claims
- 2333US6272719B2Dust-collecting barrowWINBOND ELECTRONICS CORP·Filed 1999·Granted Aug 14, 2001·7 cites·24 claims
- 2432US9530231B2Method for generating masking image using general polygonal maskNOVATEK MICROELECTRONICS CORP·Filed 2015·Granted Dec 27, 2016·0 cites·8 claims
- 2529US2015144160A1Etchant, preparation thereof and method of using the same in the cleaning processBEIJING SEVENSTAR ELECTRONICS CO LTD·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →