Inventor · disambiguated record
Yi-Te Yeh
Also filed as: YEH YI-TE
3 granted patents·6 citations·filing 2010–2019
57Inventor score
Top patents by PatentIndex Score
3 records- 0178US10598730B1Testing method and testing systemREALTEK SEMICONDUCTOR CORP·Filed 2018·Granted Mar 24, 2020·4 cites·16 claims
- 0256US10914785B2Testing method and testing systemREALTEK SEMICONDUCTOR CORP·Filed 2019·Granted Feb 9, 2021·0 cites·20 claims
- 0349US8237683B2Touch panel interface system used on touch panel, touch device, and method thereofYEH YI-TE·Filed 2010·Granted Aug 7, 2012·2 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →