Inventor · disambiguated record
Yoshikazu Aikawa
Also filed as: AIKAWA YOSHIKAZU
3 granted patents·10 pending applications·4 citations·filing 2004–2022
55Inventor score
Top patents by PatentIndex Score
13 records- 0175US8057650B2Soft magnetic FeCo based target materialHAYASHI RYOJI·Filed 2007·Granted Nov 15, 2011·3 cites·3 claims
- 0268US8066825B2(CoFe)Zr/Nb/Ta/Hf based target materialSAWADA TOSHIYUKI·Filed 2007·Granted Nov 29, 2011·1 cites·2 claims
- 0360US2025018467A1Alloy Powder Material for Additive Manufacturing, Including Oxide Nanoparticles, and Additively Manufactured ArticleSANYO SPECIAL STEEL CO LTD·Filed 2022·Application pending·0 cites
- 0459US2005159835A1Device for and method of creating a model for determining relationship between process and qualityFiled 2004·Application pending·0 cites
- 0554US11987870B2Cu-based alloy powderSANYO SPECIAL STEEL CO LTD·Filed 2020·Granted May 21, 2024·0 cites·5 claims
- 0652US2013149185A1Fe-Co Based Target Material and Method for Producing the SameSANYO SPECIAL STEEL CO LTD·Filed 2013·Application pending·0 cites
- 0751US2007135957A1Model generating apparatus, model generating system, and fault detecting apparatusOMRON TATEISI ELECTRONICS CO·Filed 2006·Application pending·0 cites
- 0850US2024392415A1Ni Alloy Powder Suitable for Additive Manufacturing and Additively Manufactured Article Obtained Using SameSANYO SPECIAL STEEL CO LTD·Filed 2022·Application pending·0 cites
- 0948US2008038145A1Fe-Co based target material and method for producing the sameSANYO SPECIAL STEEL CO LTD·Filed 2007·Application pending·0 cites
- 1048US2007251821A1Soft magnetic target materialSANYO SPECIAL STEEL CO LTD·Filed 2007·Application pending·0 cites
- 1141US2007192064A1Process fault analyzer and system, program and method thereofOMRON TATEISI ELECTRONICS CO·Filed 2007·Application pending·0 cites
- 1240US2007255442A1Process fault analyzer and method and storage mediumOMRON TATEISI ELECTRONICS CO·Filed 2007·Application pending·0 cites
- 1340US2007180324A1Apparatus and program for process fault analysisOMRON TATEISI ELECTRONICS CO·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →