Inventor · disambiguated record
Young-Soo An
Also filed as: AN YOUNG-SOO
14 granted patents·9 pending applications·107 citations·filing 1999–2019
91Inventor score
Files withSAMSUNG ELECTRONICS CO LTD12WON JONG HAK2AJOU UNIV IND ACAD COOP FOUND1AN YOUNG-SOO1CHO EUN WOO1
Top patents by PatentIndex Score
23 records- 0186US6489790B1Socket including pressure conductive rubber and mesh for testing of ball grid array packageSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Dec 3, 2002·39 cites·20 claims
- 0282US7880490B2Wireless interface probe card for high speed one-shot wafer test and semiconductor testing apparatus having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Feb 1, 2011·8 cites·20 claims
- 0381US8347216B2Mobile terminal and video sharing method thereofLG ELECTRONICS INC·Filed 2009·Granted Jan 1, 2013·12 cites·22 claims
- 0479US8866810B2Mobile terminal and display controlling method thereofCHO EUN WOO·Filed 2010·Granted Oct 21, 2014·14 cites·16 claims
- 0579US8026733B2Interface structure of wafer test equipmentSAMSUNG ELECTRONICS CO LTD·Filed 2009·Granted Sep 27, 2011·10 cites·12 claims
- 0675US7438563B2Connector for testing a semiconductor packageSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Oct 21, 2008·9 cites·32 claims
- 0774US7884628B2Interposer and probe card having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Feb 8, 2011·4 cites·20 claims
- 0861US7786721B2Multilayer type test board assembly for high-precision inspectionSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Aug 31, 2010·1 cites·11 claims
- 0959US8547766B2Area-efficient data line layouts to suppress the degradation of electrical characteristicsWON JONG-HAK·Filed 2010·Granted Oct 1, 2013·2 cites·16 claims
- 1054US7659735B2Probe card capable of multi-probingKIM MIN-GU·Filed 2006·Granted Feb 9, 2010·1 cites·12 claims
- 1146US7538566B2Electrical test system including coaxial cablesSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted May 26, 2009·0 cites·13 claims
- 1246US2008164894A1System and method for testing semiconductor integrated circuit in parallelSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
- 1345US8130577B2Semiconductor memory deviceWON JONG-HAK·Filed 2009·Granted Mar 6, 2012·1 cites·10 claims
- 1445US2010025682A1Interface device for wireless testing, semiconductor device and semiconductor package including the same, and method for wirelessly testing using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2009·Application pending·0 cites
- 1544US2007166630A1Photomasks including multi-layered light-shielding and methods of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 1644US2009189624A1Interposer and a probe card assembly for electrical die sorting and methods of operating and manufacturing the sameAJOU UNIV IND ACAD COOP FOUND·Filed 2008·Application pending·0 cites
- 1742US2021280621A1Optical disc for fingerprint recognition sensor and optical filter comprising sameLMS CO LTD·Filed 2019·Application pending·0 cites
- 1840US8139949B2Electrical signal transmission module, method of transmitting electric signals and electrical inspection apparatus having the sameLEE SANG-HOON·Filed 2008·Granted Mar 20, 2012·0 cites·13 claims
- 1939US2008164898A1Probe card for test of semiconductor chips and method for test of semiconductor chips using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 2035US6396294B2Socket pin and socket for electrical testing of semiconductor packagesSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted May 28, 2002·6 cites·19 claims
- 2134US2006076965A1Contact-free test system for semiconductor deviceAN YOUNG-SOO·Filed 2005·Application pending·0 cites
- 2234US2010176796A1Apparatus for testing electrical characteristicsKIM DONG-DAE·Filed 2010·Application pending·0 cites
- 2333US2012182653A1Semiconductor module and system including the sameLEE JOO-HAN·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →