Inventor · disambiguated record
Yong-Hwan Cho
Also filed as: CHO YONG-HWAN
5 granted patents·4 pending applications·50 citations·filing 1993–2025
76Inventor score
Files withSAMSUNG ELECTRONICS CO LTD4DONGWOO FINE CHEM CO LTD2MCM CO LTD1PO HANG IRON & STEEL1UBI COM TECHNOLOGY CO LTD1
Top patents by PatentIndex Score
9 records- 0175US7941714B2Parallel bit test apparatus and parallel bit test method capable of reducing test timeSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted May 10, 2011·11 cites·20 claims
- 0271US10293287B2Water filter assemblyMCM CO LTD·Filed 2015·Granted May 21, 2019·3 cites·12 claims
- 0365US2025270483A1Cleaning composition and method of forming photoresist pattern using the sameDONGWOO FINE CHEM CO LTD·Filed 2025·Application pending·0 cites
- 0461US5441699AApparatus for automatically analyzing liquid test samplesPO HANG IRON & STEEL·Filed 1993·Granted Aug 15, 1995·35 cites·11 claims
- 0551US2025263640A1Rinse composition and method for manufacturing device using the sameDONGWOO FINE CHEM CO LTD·Filed 2025·Application pending·0 cites
- 0645US9261555B2Methods of measuring and controlling inner temperature of a chamber included in a test handlerSAMSUNG ELECTRONICS CO LTD·Filed 2013·Granted Feb 16, 2016·1 cites·19 claims
- 0739US2008043417A1Peripheral device integrated ubiquitous multifunction personal computerUBI COM TECHNOLOGY CO LTD·Filed 2006·Application pending·0 cites
- 0834US2009044063A1Semiconductor memory device and test system of a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2007·Application pending·0 cites
- 0930US8051341B2Semiconductor memory device having test address generating circuit and method of testing semiconductor memory device having a test address generating circuitSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Nov 1, 2011·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →