Inventor · disambiguated record
Young-Bae Choi
Also filed as: CHOI YOUNG-BAE
21 granted patents·2 pending applications·494 citations·filing 1994–2015
96Inventor score
Files withHYNIX SEMICONDUCTOR INC9DAEWOO ELECTRONICS CO LTD7HAECHITECH CORP1HYUNDAI ELECTRONICS IND1LG ELECTRONICS INC1
Top patents by PatentIndex Score
23 records- 0192US5502506AApparatus for equalizing television signals with fast convergenceDAEWOO ELECTRONICS CO LTD·Filed 1994·Granted Mar 26, 1996·136 cites·1 claims
- 0287US6525581B1Duty correction circuit and a method of correcting a dutyHYNIX SEMICONDUCTOR INC·Filed 2001·Granted Feb 25, 2003·34 cites·20 claims
- 0384US7312647B2Memory device having a duty ratio correctorHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Dec 25, 2007·10 cites·19 claims
- 0483US7361228B2Showerheads for providing a gas to a substrate and apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Apr 22, 2008·15 cites·25 claims
- 0583US7064989B2On-die termination control circuit and method of generating on-die termination control signalHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Jun 20, 2006·27 cites·12 claims
- 0679US6977848B2Data output control circuitHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Dec 20, 2005·26 cites·12 claims
- 0779US5937016ASynchronization method in Viterbi decoderDAEWOO ELECTRONICS CO LTD·Filed 1997·Granted Aug 10, 1999·46 cites·2 claims
- 0878US5928378AAdd-compare-select processor in Viterbi decoderDAEWOO ELECTRONICS CO LTD·Filed 1997·Granted Jul 27, 1999·43 cites·5 claims
- 0976US9864496B2Mobile terminal and control method thereofLG ELECTRONICS INC·Filed 2014·Granted Jan 9, 2018·3 cites·19 claims
- 1075US7190203B2Memory device having a duty ratio correctorHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Mar 13, 2007·4 cites·2 claims
- 1175US7173866B2Circuit for generating data strobe signal in DDR memory device, and method thereforHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Feb 6, 2007·17 cites·30 claims
- 1274US7983101B2Circuit for generating data strobe signal in DDR memory device and method thereforHYNIX SEMICONDUCTOR INC·Filed 2010·Granted Jul 19, 2011·4 cites·13 claims
- 1372US9671484B2Magnetic sensor test apparatus and method of testing a magnetic sensorHAECHITECH CORP·Filed 2014·Granted Jun 6, 2017·5 cites·20 claims
- 1472US7023254B2Duty ratio corrector, and memory device having the sameHYNIX SEMICONDUCTOR INC·Filed 2004·Granted Apr 4, 2006·15 cites·6 claims
- 1571US5675394AEqualization apparatus with effective coefficient updating operationDAEWOO ELECTRONICS CO LTD·Filed 1995·Granted Oct 7, 1997·42 cites·4 claims
- 1665US7710799B2Circuit for generating data strobe in DDR memory device, and method thereforHYNIX SEMICONDUCTOR INC·Filed 2006·Granted May 4, 2010·4 cites·15 claims
- 1758US5878092ATrace-back method and apparatus for use in a viterbi decoderDAEWOO ELECTRONICS CO LTD·Filed 1997·Granted Mar 2, 1999·20 cites·7 claims
- 1852US5930298AViterbi decoder for decoding depunctured codeDAEWOO ELECTRONICS CO LTD·Filed 1997·Granted Jul 27, 1999·15 cites·6 claims
- 1949US5832001AVariable rate viterbi decorderDAEWOO ELECTRONICS CO LTD·Filed 1997·Granted Nov 3, 1998·24 cites·3 claims
- 2048US6385106B2Synchronous type flip-flop circuit of semiconductor deviceHYUNDAI ELECTRONICS IND·Filed 2000·Granted May 7, 2002·4 cites·10 claims
- 2148US2006011298A1Showerhead with branched gas receiving channel and apparatus including the same for use in manufacturing semiconductor substratesLIM JI-EUN·Filed 2005·Application pending·0 cites
- 2238US2005155551A1Deposition apparatus and related methods including a pulse fluid supplier having a bufferFiled 2004·Application pending·0 cites
- 2337US10060969B2Test board unit and apparatus for testing a semiconductor chip including the sameSK HYNIX INC·Filed 2015·Granted Aug 28, 2018·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →