Inventor · disambiguated record
Yoel Cohen
Also filed as: COHEN YOEL
35 granted patents·2 pending applications·456 citations·filing 1998–2024
97Inventor score
Files withNOVA MEASURING INSTR LTD17ADOM ADVANCED OPTICAL TECH LTD15COHEN YOEL2Asayag Energy Ltd1DISHON GIORA1
Top patents by PatentIndex Score
37 records- 0195US6704920B2Process control for micro-lithographyNOVA MEASURING INSTR LTD·Filed 2001·Granted Mar 9, 2004·101 cites·17 claims
- 0292US6166801AMonitoring apparatus and method particularly useful in photolithographically processing substratesNOVA MEASURING INSTR LTD·Filed 1998·Granted Dec 26, 2000·154 cites·20 claims
- 0391US10024650B2System for analyzing optical properties of an objectADOM ADVANCED OPTICAL TECH LTD·Filed 2015·Granted Jul 17, 2018·4 cites·8 claims
- 0491US9757027B2System and method for performing tear film structure measurement and evaporation rate measurementsADOM ADVANCED OPTICAL TECH LTD·Filed 2016·Granted Sep 12, 2017·6 cites·24 claims
- 0590US7289190B2Monitoring apparatus and method particularly useful in photolithographicallyNOVA MEASURING INSTR LTD·Filed 2006·Granted Oct 30, 2007·9 cites·26 claims
- 0689US8289515B2Method and system for use in monitoring properties of patterned structuresCOHEN YOEL·Filed 2008·Granted Oct 16, 2012·13 cites·31 claims
- 0788US6424417B1Method and system for controlling the photolithography processNOVA MEASURING INSTR LTD·Filed 1998·Granted Jul 23, 2002·68 cites·20 claims
- 0887US6842220B1Monitoring apparatus and method particularly useful in photolithographically processing substratesNOVA MEASURING INSTR LTD·Filed 2000·Granted Jan 11, 2005·24 cites·21 claims
- 0985US9833139B1System and method for performing tear film structure measurementADOM ADVANCED OPTICAL TECH LTD·Filed 2017·Granted Dec 5, 2017·3 cites·22 claims
- 1084US9291911B2Monitoring apparatus and method particularly useful in photolithographically processing substratesNOVA MEASURING INSTR LTD·Filed 2014·Granted Mar 22, 2016·3 cites·23 claims
- 1183US6643017B2Method and system for controlling the photolithography processNOVA MEASURING INSTR LTD·Filed 2002·Granted Nov 4, 2003·22 cites·33 claims
- 1282US10612913B2Apparatus and methods for performing tomography and/or topography measurements on an objectADOM ADVANCED OPTICAL TECH LTD·Filed 2018·Granted Apr 7, 2020·1 cites·25 claims
- 1382US10456029B2Apparatus and method for detecting surface topographyADOM ADVANCED OPTICAL TECH LTD·Filed 2017·Granted Oct 29, 2019·2 cites·20 claims
- 1482US7525634B2Monitoring apparatus and method particularly useful in photolithographicallyNOVA MEASURING INSTR LTD·Filed 2007·Granted Apr 28, 2009·4 cites·26 claims
- 1580US7595896B2Thin films measurement method and systemNOVA MEASURING INSTR LTD·Filed 2008·Granted Sep 29, 2009·5 cites·13 claims
- 1679US7030957B2Monitoring apparatus and method particularly useful in photolithographically processing substratesNOVA MEASURING INSTR LTD·Filed 2004·Granted Apr 18, 2006·13 cites·44 claims
- 1777US10054419B2Method for analyzing an object using a combination of long and short coherence interferometryADOM ADVANCED OPTICAL TECH LTD·Filed 2015·Granted Aug 21, 2018·2 cites·16 claims
- 1874US7327476B2Thin films measurement method and systemNOVA MEASURING INSTR LTD·Filed 2003·Granted Feb 5, 2008·12 cites·13 claims
- 1973US10024783B2Interferometric ellipsometry and method using conical refractionADOM ADVANCED OPTICAL TECH LTD·Filed 2015·Granted Jul 17, 2018·1 cites·18 claims
- 2073US8482715B2Monitoring apparatus and method particularly useful in photolithographically processing substratesDISHON GIORA·Filed 2010·Granted Jul 9, 2013·2 cites·20 claims
- 2170US8040532B2Thin films measurement method and systemNOVA MEASURING INSTR LTD·Filed 2009·Granted Oct 18, 2011·2 cites·17 claims
- 2266US10119903B2Interferometric ellipsometry and method using conical refractionADOM ADVANCED OPTICAL TECH LTD·Filed 2018·Granted Nov 6, 2018·0 cites·12 claims
- 2364US8964178B2Method and system for use in monitoring properties of patterned structuresNOVA MEASURING INSTR LTD·Filed 2013·Granted Feb 24, 2015·1 cites·15 claims
- 2463US6720568B2Method and system for optical inspection of a structure formed with a surface reliefNOVA MEASURING INSTR LTD·Filed 2001·Granted Apr 13, 2004·4 cites·24 claims
- 2561US10415954B2Method for analyzing an objectADOM ADVANCED OPTICAL TECH LTD·Filed 2018·Granted Sep 17, 2019·0 cites·20 claims
- 2661US10330462B2System for analyzing optical properties of an objectADOM ADVANCED OPTICAL TECH LTD·Filed 2018·Granted Jun 25, 2019·0 cites·22 claims
- 2761US8780320B2Monitoring apparatus and method particularly useful in photolithographically processing substratesNOVA MEASURING INSTR LTD·Filed 2013·Granted Jul 15, 2014·0 cites·26 claims
- 2861US7821614B2Monitoring apparatus and method particularly useful in photolithographically processing substratesNOVA MEASURING INSTR LTD·Filed 2009·Granted Oct 26, 2010·0 cites·19 claims
- 2960US2024275328A1Dual Axis Solar Tracking ModuleAsayag Energy Ltd·Filed 2024·Application pending·0 cites
- 3058US12023099B2System and method for performing tear film structure measurementADOM ADVANCED OPTICAL TECH LTD·Filed 2021·Granted Jul 2, 2024·0 cites·26 claims
- 3156US10054429B2System for tomography and/or topography measurements of a layered objectsADOM ADVANCED OPTICAL TECH LTD·Filed 2015·Granted Aug 21, 2018·0 cites·19 claims
- 3253US8643842B2Method and system for use in monitoring properties of patterned structuresNOVA MEASURING INSTR LTD·Filed 2012·Granted Feb 4, 2014·0 cites·20 claims
- 3351US8564793B2Thin films measurement method and systemCOHEN YOEL·Filed 2011·Granted Oct 22, 2013·0 cites·10 claims
- 3448US11116394B2System and method for performing tear film structure measurementADOM ADVANCED OPTICAL TECH LTD·Filed 2017·Granted Sep 14, 2021·0 cites·29 claims
- 3548US2005183298A1Display aidFiled 2004·Application pending·0 cites
- 3647US11965777B2Apparatus and methods for calibrating optical measurementsADOM ADVANCED OPTICAL TECH LTD·Filed 2019·Granted Apr 23, 2024·0 cites·19 claims
- 3743US12213733B2System and method for detecting physical characteristics of a multilayered tissue of a subjectADOM ADVANCED OPTICAL TECH LTD·Filed 2021·Granted Feb 4, 2025·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →