Inventor · disambiguated record
Yonghang Fu
Also filed as: FU YONGHANG
3 granted patents·1 pending application·36 citations·filing 2000–2021
70Inventor score
Top patents by PatentIndex Score
4 records- 0184US7539583B2Method and system for defect detectionRUDOLPH TECHNOLOGIES INC·Filed 2005·Granted May 26, 2009·15 cites·19 claims
- 0273US6864971B2System and method for performing optical inspection utilizing diffracted lightISOA INC·Filed 2002·Granted Mar 8, 2005·13 cites·22 claims
- 0355US6813376B1System and method for detecting defects on a structure-bearing surface using optical inspectionRUDOLPH TECHNOLOGIES INC·Filed 2000·Granted Nov 2, 2004·8 cites·3 claims
- 0441US2023393220A1Systems and methods for use in handling componentsELECTRO SCIENT IND INC·Filed 2021·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →