Inventor · disambiguated record
Yoshihiko Fujimori
Also filed as: FUJIMORI YOSHIHIKO
8 granted patents·5 pending applications·175 citations·filing 1988–2015
85Inventor score
Top patents by PatentIndex Score
13 records- 0184US5046109APattern inspection apparatusNIKON CORP·Filed 1990·Granted Sep 3, 1991·137 cites·9 claims
- 0281US7907268B2Surface inspection method and surface inspection deviceNIKON CORP·Filed 2010·Granted Mar 15, 2011·4 cites·19 claims
- 0370US10460998B2Method for inspecting substrate, substrate inspection apparatus, exposure system, and method for producing semiconductor deviceFUJIMORI YOSHIHIKO·Filed 2011·Granted Oct 29, 2019·4 cites·31 claims
- 0466US10352875B2Inspection apparatus, inspection method, exposure method, and method for manufacturing semiconductor deviceFUKAZAWA KAZUHIKO·Filed 2011·Granted Jul 16, 2019·2 cites·33 claims
- 0564US9240356B2Surface inspection apparatus, method for inspecting surface, exposure system, and method for producing semiconductor deviceFUKAZAWA KAZUHIKO·Filed 2011·Granted Jan 19, 2016·1 cites·12 claims
- 0653US9322788B2Surface inspection apparatus, method for inspecting surface, exposure system, and method for producing semiconductor deviceNIKON CORP·Filed 2015·Granted Apr 26, 2016·0 cites·9 claims
- 0752US2009079983A1Surface inspection deviceNIKON CORP·Filed 2008·Application pending·0 cites
- 0849US4942619APattern inspecting apparatusNIKON CORP·Filed 1988·Granted Jul 17, 1990·19 cites·5 claims
- 0943US4870693AMask inspecting apparatusNIKON CORP·Filed 1988·Granted Sep 26, 1989·8 cites·27 claims
- 1042US2009074285A1Surface inspection deviceNIKON CORP·Filed 2008·Application pending·0 cites
- 1139US2014315330A1Measurement device, measurement method, and method for manufacturing semiconductor deviceNIKON CORP·Filed 2012·Application pending·0 cites
- 1239US2010182603A1Surface Inspection DeviceFUJIMORI YOSHIHIKO·Filed 2010·Application pending·0 cites
- 1335US2009316978A1Manufacturing method for inspection deviceFUJIMORI YOSHIHIKO·Filed 2009·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Yoshihiko Fujimori files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →