Inventor · disambiguated record
Young-Sik Ghim
Also filed as: GHIM YOUNG SIK
9 granted patents·17 citations·filing 2005–2023
79Inventor score
Files withKOREA RES INST STANDARDS & SCI6KOREA RES INSTITUTE OF STANDARD AND SCIENCE2KOREA ADVANCED INST SCI & TECH1
Top patents by PatentIndex Score
9 records- 0180US7483147B2Apparatus and method for measuring thickness and profile of transparent thin film using white-light interferometerKOREA ADVANCED INST SCI & TECH·Filed 2005·Granted Jan 27, 2009·13 cites·5 claims
- 0272US11906281B2Device and method for measuring thickness and refractive index of multilayer thin film by using angle-resolved spectral reflectometryKOREA RES INST STANDARDS & SCI·Filed 2018·Granted Feb 20, 2024·2 cites·2 claims
- 0365US11466978B2Apparatus and method for measuring the thickness and refractive index of multilayer thin films using angle-resolved spectral interference image according to polarizationKOREA RES INSTITUTE OF STANDARD AND SCIENCE·Filed 2019·Granted Oct 11, 2022·1 cites·13 claims
- 0455US12474165B2Calibration method for deflectometry method, for improving measurement accuracyKOREA RES INSTITUTE OF STANDARD AND SCIENCE·Filed 2023·Granted Nov 18, 2025·0 cites·16 claims
- 0555US9863814B2Correction of rotational inaccuracy in lateral shearing interferometryKOREA RES INST STANDARDS & SCI·Filed 2014·Granted Jan 9, 2018·1 cites·9 claims
- 0647US11243070B2Apparatus and method for multilayer thin film thickness measurement using single-shot angle-resolved spectral reflectometryKOREA RES INST STANDARDS & SCI·Filed 2020·Granted Feb 8, 2022·0 cites·7 claims
- 0742US11486700B2System and method for 3D shape measurement of freeform surface based on high-speed deflectometry using composite patternsKOREA RES INST STANDARDS & SCI·Filed 2019·Granted Nov 1, 2022·0 cites·16 claims
- 0842US11255662B2System and method for compensating for non-linear response characteristic in phase-shifting deflectometryKOREA RES INST STANDARDS & SCI·Filed 2018·Granted Feb 22, 2022·0 cites·6 claims
- 0939US10466031B2Apparatus for measuring thickness and surface profile of multilayered film structure using imaging spectral optical system and measuring methodKOREA RES INST STANDARDS & SCI·Filed 2016·Granted Nov 5, 2019·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →