Inventor · disambiguated record
Yoshinori Hagio
Also filed as: HAGIO YOSHINORI
8 granted patents·3 pending applications·18 citations·filing 2005–2016
79Inventor score
Files withTOSHIBA KK6SEIKO EPSON CORP2HAGIO YOSHINORI1NIPPON STEEL & SUMITOMO METAL CORP1TOSHIBA MEMORY CORP1
Top patents by PatentIndex Score
11 records- 0182US9244365B2Method for measuring pattern misalignmentTOSHIBA KK·Filed 2013·Granted Jan 26, 2016·4 cites·16 claims
- 0273US9469313B2Bogie frame for railway vehiclesNIPPON STEEL & SUMITOMO METAL CORP·Filed 2013·Granted Oct 18, 2016·4 cites·7 claims
- 0372US7454831B2Method for mounting an electronic element on a wiring boardSEIKO EPSON CORP·Filed 2005·Granted Nov 25, 2008·8 cites·8 claims
- 0469US8859167B2Pattern forming method, positional deviation measuring method and photomaskHAGIO YOSHINORI·Filed 2012·Granted Oct 14, 2014·2 cites·5 claims
- 0549US9146458B2EUV maskTOSHIBA KK·Filed 2013·Granted Sep 29, 2015·0 cites·5 claims
- 0644US9136224B2Alignment mark, photomask, and method for forming alignment markTOSHIBA KK·Filed 2014·Granted Sep 15, 2015·0 cites·16 claims
- 0744US2016043037A1Mark, semiconductor device, and semiconductor waferTOSHIBA KK·Filed 2014·Application pending·0 cites
- 0841US9502357B2Alignment mark formation method and semiconductor deviceTOSHIBA KK·Filed 2015·Granted Nov 22, 2016·0 cites·20 claims
- 0940US2007210458A1Semiconductor device and method for manufacturing semiconductor deviceSEIKO EPSON CORP·Filed 2007·Application pending·0 cites
- 1037US9941177B2Pattern accuracy detecting apparatus and processing systemTOSHIBA MEMORY CORP·Filed 2016·Granted Apr 10, 2018·0 cites·13 claims
- 1133US2016379902A1Measurement apparatus, measurement method, and manufacturing method of semiconductor deviceTOSHIBA KK·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →