Inventor · disambiguated record
Yoon Taek Han
Also filed as: HAN YOON TAEK
2 granted patents·2 citations·filing 2018–2020
40Inventor score
Technology areasH10P
Files withSAMSUNG ELECTRONICS CO LTD2
Top patents by PatentIndex Score
2 records- 0176US10831095B2Critical dimension measurement system and method of measuring critical dimensions using sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Nov 10, 2020·2 cites·20 claims
- 0261US11397380B2Critical dimension measurement system and method of measuring critical dimensions using sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Jul 26, 2022·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →