Inventor · disambiguated record
You Hie Han
Also filed as: HAN YOU-HIE
7 granted patents·3 pending applications·62 citations·filing 2000–2010
83Inventor score
Top patents by PatentIndex Score
10 records- 0169US6590180B1Laser welding systemKOREA MACH & MATERIALS INST·Filed 2000·Granted Jul 8, 2003·20 cites·10 claims
- 0267US6808117B2Method and apparatus for calibrating marking position in chip scale markerEO TECHNICS CO LTD·Filed 2002·Granted Oct 26, 2004·19 cites·25 claims
- 0360US6710286B2Chip scale marker and making methodEO TECHNICS CO LTD·Filed 2002·Granted Mar 23, 2004·11 cites·23 claims
- 0450US7164519B2Laser processing apparatus and method using polygon mirrorEO TECHNICS CO LTD·Filed 2004·Granted Jan 16, 2007·5 cites·4 claims
- 0549US6870127B2Chip scale marker and marking methodEO TECHNICS CO LTD·Filed 2003·Granted Mar 22, 2005·4 cites·27 claims
- 0648US6794205B2Chip scale marker and method of calibrating marking positionEO TECHNICS CO LTD·Filed 2003·Granted Sep 21, 2004·3 cites·17 claims
- 0740US2011223478A1Secondary battery and secondary battery module using the sameIPG PHOTONICS KOREA LTD·Filed 2010·Application pending·0 cites
- 0837US7126083B2Chip scale marker and method of calibrating marking positionEO TECHNICS CO LTD·Filed 2004·Granted Oct 24, 2006·0 cites·15 claims
- 0935US2005218128A1Laser processing apparatus with polygon mirrorHAN YOU-HIE·Filed 2004·Application pending·0 cites
- 1033US2004101000A1Laser system for dual wavelength and chip scale marker having the sameEO TECHNICS CO LTD·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →