Inventor · disambiguated record
Yoshiyuki Horibe
Also filed as: HORIBE YOSHIYUKI · SYOZI TOSHIAKI
4 granted patents·3 pending applications·71 citations·filing 1978–2004
78Inventor score
Top patents by PatentIndex Score
7 records- 0190US4203025AThick-film thermal printing headHITACHI LTD·Filed 1978·Granted May 13, 1980·50 cites·17 claims
- 0264US6358663B2Fluorescent pattern, process for preparing the same, organic alkali developing solution for forming the same, emulsion developing solution for forming the same and back plate for plasma display using the sameHITACHI CHEMICAL CO LTD·Filed 2001·Granted Mar 19, 2002·4 cites·2 claims
- 0354US6391504B2Process for preparing phosphor pattern for field emission display panel, photosensitive element for field emission display panel, phosphor pattern for field emission display panel and field display panelHITACHI CHEMICAL CO LTD·Filed 1998·Granted May 21, 2002·9 cites·13 claims
- 0453US6232024B1Fluorescent pattern, process for preparing the same, organic alkali developing solution for forming the same, emulsion developing solution for forming the same and back plate for plasma display using the sameHITACHI CHEMICAL CO LTD·Filed 1998·Granted May 15, 2001·8 cites·13 claims
- 0543US2004166443A1Process for preparing phosphor pattern for field emission display panel, photosensitive element for field emission display panel, phosphor pattern for field emission display panel and field emission display panelFiled 2004·Application pending·0 cites
- 0641US2002037478A1Fluorescent pattern, process for preparing the same, organic alkali developing solution for forming the same, emulsion developing solution for forming the same and back plate for plasma display using the sameFiled 2001·Application pending·0 cites
- 0741US2002142237A1Process for preparing phosphor pattern for field emission display panel, photosensitive element for field emission display panel, phosphor pattern for field emission display panel and field emission display panelFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →