Inventor · disambiguated record
Yoshinobu Hoshino
Also filed as: HOSHINO YOSHINOBU
17 granted patents·1 pending application·63 citations·filing 1981–2021
90Inventor score
Files withHITACHI HIGH TECH CORP12HOSHINO YOSHINOBU2KAMIO Masato1KATSURA MACHINE CO1MITSUBISHI ELECTRIC CORP1
Top patents by PatentIndex Score
18 records- 0189US7705304B2Scanning electron microscope and three-dimensional shape measuring device that used itHITACHI HIGH TECH CORP·Filed 2008·Granted Apr 27, 2010·13 cites·8 claims
- 0277US10522325B2Charged particle beam device and image processing method in charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Dec 31, 2019·2 cites·17 claims
- 0370US11538657B2Alignment system and seal for positional alignmentHITACHI HIGH TECH CORP·Filed 2019·Granted Dec 27, 2022·2 cites·16 claims
- 0469US6499985B1Apparatus for changing a mold box for a concrete block molding machineKATSURA MACHINE CO·Filed 1999·Granted Dec 31, 2002·26 cites·3 claims
- 0563US10763078B2Charged particle beam device and image processing method in charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 1, 2020·0 cites·17 claims
- 0662US10763074B2Charged particle beam apparatus, observation method using charged particle beam apparatus, and programHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 1, 2020·0 cites·3 claims
- 0762US8848049B2Charged particle beam device and method for correcting detected signal thereofKAMIO Masato·Filed 2011·Granted Sep 30, 2014·2 cites·16 claims
- 0852US10453650B2Charged particle beam apparatus, observation method using charged particle beam apparatus, and programHITACHI HIGH TECH CORP·Filed 2015·Granted Oct 22, 2019·0 cites·18 claims
- 0951US4385845AFlywheel apparatus for storing electrical energyMITSUBISHI ELECTRIC CORP·Filed 1981·Granted May 31, 1983·15 cites·2 claims
- 1047US12170183B2Charged particle microscope device and method for adjusting field-of-view thereofHITACHI HIGH TECH CORP·Filed 2019·Granted Dec 17, 2024·0 cites·15 claims
- 1147US2024412333A1Observation system and artifact correction method for sameHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1245US11385193B2Imaging deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Jul 12, 2022·0 cites·12 claims
- 1341US11239050B2Imaging deviceHITACHI HIGH TECH CORP·Filed 2017·Granted Feb 1, 2022·0 cites·17 claims
- 1439US11508047B2Charged particle microscope device and wide-field image generation methodHITACHI HIGH TECH CORP·Filed 2017·Granted Nov 22, 2022·0 cites·20 claims
- 1539US10431417B2Charged particle beam device and sample holderHITACHI HIGH TECH CORP·Filed 2016·Granted Oct 1, 2019·0 cites·12 claims
- 1638US9099283B2Charged particle beam apparatusHOSHINO YOSHINOBU·Filed 2010·Granted Aug 4, 2015·0 cites·8 claims
- 1737US8947520B2Electron microscopeHOSHINO YOSHINOBU·Filed 2010·Granted Feb 3, 2015·0 cites·9 claims
- 1833US4999247AMethod of forming a colored coating film on a cross-linked polyethylene sheet or electric wireYAZAKI CORP·Filed 1989·Granted Mar 12, 1991·3 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →