Inventor · disambiguated record
Young Do Hur
Also filed as: HUR YOUNG-DO
23 granted patents·1 pending application·283 citations·filing 1998–2019
95Inventor score
Files withHYNIX SEMICONDUCTOR INC13SK HYNIX INC6HUR YOUNG-DO2HYUNDAI ELECTRONICS IND1LG SEMICON CO LTD1
Top patents by PatentIndex Score
24 records- 0194US6744687B2Semiconductor memory device with mode register and method for controlling deep power down mode thereinHYNIX SEMICONDUCTOR INC·Filed 2002·Granted Jun 1, 2004·120 cites·20 claims
- 0293US8953403B1Semiconductor memory deviceSK HYNIX INC·Filed 2013·Granted Feb 10, 2015·21 cites·14 claims
- 0381US11030040B2Memory device detecting an error in write data during a write operation, memory system including the same, and operating method of memory systemSK HYNIX INC·Filed 2018·Granted Jun 8, 2021·3 cites·19 claims
- 0475US7768842B2Semiconductor memory device voltage generating circuit for avoiding leakage currents of parasitic diodesHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Aug 3, 2010·9 cites·24 claims
- 0575US7212046B2Power-up signal generating apparatusHYNIX SEMICONDUCTOR INC·Filed 2004·Granted May 1, 2007·22 cites·25 claims
- 0673US10915398B2Memory system and operating method thereofSK HYNIX INC·Filed 2019·Granted Feb 9, 2021·3 cites·18 claims
- 0773US10884848B2Memory device, memory system including the same and operation method of the memory systemSK HYNIX INC·Filed 2019·Granted Jan 5, 2021·3 cites·18 claims
- 0872US6639854B2Redundancy circuit of semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2001·Granted Oct 28, 2003·21 cites·32 claims
- 0970US5952872AInput/output voltage detection type substrate voltage generation circuitLG SEMICON CO LTD·Filed 1998·Granted Sep 14, 1999·29 cites·20 claims
- 1065US10810080B2Memory device selectively correcting an error in data during a read operation, memory system including the same, and operating method of memory systemSK HYNIX INC·Filed 2018·Granted Oct 20, 2020·2 cites·10 claims
- 1161US6545531B1Power voltage driver circuit for low power operation modeHYNIX SEMICONDUCTOR INC·Filed 2001·Granted Apr 8, 2003·12 cites·13 claims
- 1260US6518831B1Boosting circuit for high voltage operationHYNIX SEMICONDUCTOR INC·Filed 2001·Granted Feb 11, 2003·12 cites·5 claims
- 1356US8319544B2Determining and using dynamic voltage scaling modeHUR YOUNG DO·Filed 2010·Granted Nov 27, 2012·2 cites·23 claims
- 1455US7944278B2Circuit for generating negative voltage and semiconductor memory apparatus using the sameHYNIX SEMICONDUCTOR INC·Filed 2008·Granted May 17, 2011·3 cites·19 claims
- 1552US7831405B2Semiconductor package capable of performing various tests and method of testing the sameHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Nov 9, 2010·2 cites·24 claims
- 1652US6141279ARefresh control circuitHYUNDAI ELECTRONICS IND·Filed 1999·Granted Oct 31, 2000·15 cites·19 claims
- 1751US7751230B2Negative voltage generating deviceHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Jul 6, 2010·2 cites·33 claims
- 1850US7852139B2Apparatus for generating internal voltage in semiconductor integrated circuitHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Dec 14, 2010·2 cites·16 claims
- 1943US10901842B2Memory system and operating method thereofSK HYNIX INC·Filed 2019·Granted Jan 26, 2021·0 cites·20 claims
- 2041US7840368B2Test circuit for performing multiple test modesHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Nov 23, 2010·0 cites·24 claims
- 2139US8687447B2Semiconductor memory apparatus and test method using the sameSONG CHOUNG KI·Filed 2009·Granted Apr 1, 2014·0 cites·18 claims
- 2239US7890286B2Test circuit for performing multiple test modesHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Feb 15, 2011·0 cites·24 claims
- 2335US2007070672A1Semiconductor device and driving method thereofHYNIX SEMICONDUCTOR INC·Filed 2006·Application pending·0 cites
- 2432US7830999B2Apparatus and method of generating clock signal of semiconductor memoryHUR YOUNG-DO·Filed 2006·Granted Nov 9, 2010·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →