Inventor · disambiguated record
Yoshikazu Iizuka
Also filed as: IIZUKA YOSHIKAZU
6 granted patents·1 pending application·13 citations·filing 2005–2021
74Inventor score
Top patents by PatentIndex Score
7 records- 0171US7238958B2Fault position identification system for a semiconductor device and method of identifying a fault position of a semiconductor deviceTOSHIBA KK·Filed 2005·Granted Jul 3, 2007·8 cites·20 claims
- 0259US9128143B2Semiconductor device failure analysis system and semiconductor memory deviceTOSHIBA KK·Filed 2013·Granted Sep 8, 2015·1 cites·17 claims
- 0351US12235770B2Failure analysis system of semiconductor device, failure analysis method of semiconductor device, and non-transitory computer readable mediumKIOXIA CORP·Filed 2021·Granted Feb 25, 2025·0 cites·18 claims
- 0451US8316264B2Failure analysis method, failure analysis apparatus, and computer program productIIZUKA YOSHIKAZU·Filed 2010·Granted Nov 20, 2012·2 cites·14 claims
- 0550US8479063B2Failure analyzing device and failure analyzing methodIIZUKA YOSHIKAZU·Filed 2010·Granted Jul 2, 2013·2 cites·13 claims
- 0645US7716549B2Semiconductor apparatus and testing methodTOSHIBA KK·Filed 2007·Granted May 11, 2010·0 cites·14 claims
- 0725US2012011421A1Fail analysis system and method for semiconductor deviceKODAMA MAMI·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →