Inventor · disambiguated record
Yoichi Iki
Also filed as: IKI YOICHI
8 granted patents·3 pending applications·179 citations·filing 1989–2008
88Inventor score
Top patents by PatentIndex Score
11 records- 0173US8094914B2Microscope system and image processing method used for observation of a specimenIKI YOICHI·Filed 2005·Granted Jan 10, 2012·16 cites·10 claims
- 0250US2009042238A1Method of evaluating cell function, system for evaluating cell function, fluorescent microscope system, phototherapy method and phototherapy systemNIKON CORP·Filed 2008·Application pending·0 cites
- 0346US5691800AOphthalmologic apparatusNIKON CORP·Filed 1996·Granted Nov 25, 1997·58 cites·6 claims
- 0444US5555039AEye measuring apparatus having an automatic fogging producing mechanism and method thereofNIKON CORP·Filed 1995·Granted Sep 10, 1996·40 cites·33 claims
- 0539US5548355AOphthalmologic apparatus detecting position of bright points on an eye to be examinedNIKON CORP·Filed 1993·Granted Aug 20, 1996·27 cites·15 claims
- 0639US2002049748A1File management apparatus and recording medium on which a file management program is recordedNIKON CORP·Filed 2001·Application pending·0 cites
- 0736US2001030654A1Image processing apparatus and computer-readable mediumNIKON CORP·Filed 2001·Application pending·0 cites
- 0835US5815240AOphthalmologic device having means for classifying the picture data in the frame memory into the bright point regions and the mask regionsNIKON CORP·Filed 1997·Granted Sep 29, 1998·20 cites·20 claims
- 0934US5039213AOptical equipment with a semitransparent mirrorNIKON CORP·Filed 1989·Granted Aug 13, 1991·4 cites·6 claims
- 1031US5737058AEye examination apparatus using ultrasonic wave radiationNIKON CORP·Filed 1996·Granted Apr 7, 1998·9 cites·4 claims
- 1128US5883693AOphthalmic refractorNIKON CORP·Filed 1997·Granted Mar 16, 1999·5 cites·8 claims
Join the waitlist — get patent alerts
Get an alert when Yoichi Iki files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →