Inventor · disambiguated record
Yoko Inoue
Also filed as: INOUE YOKO
20 granted patents·11 pending applications·161 citations·filing 1995–2022
92Inventor score
Top patents by PatentIndex Score
31 records- 0188US5502331ASemiconductor substrate containing bulk micro-defectTOSHIBA KK·Filed 1995·Granted Mar 26, 1996·99 cites·1 claims
- 0275US10355441B2Laser module and laser processing apparatusMITSUBISHI ELECTRIC CORP·Filed 2016·Granted Jul 16, 2019·2 cites·14 claims
- 0374US11506449B2Refrigerator and refrigerator systemMITSUBISHI ELECTRIC CORP·Filed 2017·Granted Nov 22, 2022·2 cites·12 claims
- 0474US7672550B2Illumination light source and image display apparatusMITSUBISHI ELECTRIC CORP·Filed 2008·Granted Mar 2, 2010·8 cites·12 claims
- 0572US11719714B2Automatic analyzerHITACHI HIGH TECH CORP·Filed 2019·Granted Aug 8, 2023·1 cites·6 claims
- 0671US6846080B2Image display apparatusMITSUBISHI ELECTRIC CORP·Filed 2003·Granted Jan 25, 2005·10 cites·5 claims
- 0770US7830609B2Laser light beam coupling apparatusMITSUBISHI ELECTRIC CORP·Filed 2008·Granted Nov 9, 2010·5 cites·14 claims
- 0866US11852405B2Refrigerator systemMITSUBISHI ELECTRIC CORP·Filed 2018·Granted Dec 26, 2023·1 cites·16 claims
- 0961US6008110ASemiconductor substrate and method of manufacturing sameTOSHIBA KK·Filed 1997·Granted Dec 28, 1999·27 cites·17 claims
- 1060US2025170674A1Laser machining head and laser machineMITSUBISHI ELECTRIC CORP·Filed 2022·Application pending·0 cites
- 1159US8264762B2Image displaying apparatus and display controlling deviceINOUE YOKO·Filed 2007·Granted Sep 11, 2012·2 cites·4 claims
- 1257US11822125B2Multiplexing optical systemMITSUBISHI ELECTRIC CORP·Filed 2019·Granted Nov 21, 2023·0 cites·19 claims
- 1354US6721346B2Solid state laser apparatusMITSUBISHI ELECTRIC CORP·Filed 2001·Granted Apr 13, 2004·4 cites·12 claims
- 1454US2022383550A1Method for assessing assessment targets, image processing device, system for assessing assessment targetsSUMITOMO CHEMICAL CO·Filed 2020·Application pending·0 cites
- 1552US2010074580A1Light source unit and image displaying apparatusAIZAWA JYUNICHI·Filed 2009·Application pending·0 cites
- 1648US9862921B2Method for determining cell state and autoanalyzer using said methodHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 9, 2018·0 cites·3 claims
- 1748US2023078595A1Automatic analyzerHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1846US10810969B2Texture display device, texture display method, and texture display programMITSUBISHI ELECTRIC CORP·Filed 2017·Granted Oct 20, 2020·0 cites·6 claims
- 1946US9411220B2Laser light source apparatus and image display apparatus therewithMIYAMOTO NORIYUKI·Filed 2011·Granted Aug 9, 2016·0 cites·6 claims
- 2045US2008288518A1Content data block processingMOTOROLA INC·Filed 2007·Application pending·0 cites
- 2144US11327089B2Automatic analysis deviceHITACHI HIGH TECH CORP·Filed 2018·Granted May 10, 2022·0 cites·5 claims
- 2243US2022283195A1Automatic analysis deviceHITACHI HIGH TECH CORP·Filed 2020·Application pending·0 cites
- 2342US7936419B2Illumination light source and image display apparatusMITSUBISHI ELECTRIC CORP·Filed 2007·Granted May 3, 2011·0 cites·9 claims
- 2442US2022163788A1Obstacle detection apparatusMITSUBISHI ELECTRIC CORP·Filed 2019·Application pending·0 cites
- 2541US11656238B2Automatic analyzerHITACHI HIGH TECH CORP·Filed 2018·Granted May 23, 2023·0 cites·12 claims
- 2638US11041874B2Automatic analyzerHITACHI HIGH TECH CORP·Filed 2017·Granted Jun 22, 2021·0 cites·10 claims
- 2737US2011280272A1Laser light source deviceYANAGISAWA TAKAYUKI·Filed 2011·Application pending·0 cites
- 2836US2014091198A1Laser output measurement mechanismMITSUBISHI ELECTRIC CORP·Filed 2011·Application pending·0 cites
- 2934US9534953B2Laser output measuring apparatusSHODA FUMIO·Filed 2011·Granted Jan 3, 2017·0 cites·5 claims
- 3031US2006278918A1Semiconductor device and method for fabricating the sameINOUE YOKO·Filed 2006·Application pending·0 cites
- 3128US2011228230A1Laser light source device and image display apparatusINOUE YOKO·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →