Inventor · disambiguated record
Yoriyuki Ishibashi
Also filed as: ISHIBASHI YORIYUKI
10 granted patents·1 pending application·511 citations·filing 1987–2002
91Inventor score
Files withTOSHIBA KK10
Top patents by PatentIndex Score
11 records- 0197US4848911AMethod for aligning first and second objects, relative to each other, and apparatus for practicing this methodTOSHIBA KK·Filed 1987·Granted Jul 18, 1989·209 cites·33 claims
- 0296US5151754AMethod and an apparatus for measuring a displacement between two objects and a method and an apparatus for measuring a gap distance between two objectsTOSHIBA KK·Filed 1990·Granted Sep 29, 1992·160 cites·33 claims
- 0380US5946282AOptical recording/reproducing apparatusTOSHIBA KK·Filed 1998·Granted Aug 31, 1999·35 cites·10 claims
- 0472US5883385AMultibeam scanning method and apparatus with positional adjustment featuresTOSHIBA KK·Filed 1996·Granted Mar 16, 1999·48 cites·21 claims
- 0566US5100234AMethod and apparatus for aligning two objects, and method and apparatus for providing a desired gap between two objectsTOSHIBA KK·Filed 1990·Granted Mar 31, 1992·18 cites·21 claims
- 0663US4838693AMethod and apparatus for setting a gap between first and second objects to a predetermined distanceTOSHIBA KK·Filed 1987·Granted Jun 13, 1989·16 cites·40 claims
- 0760US6633531B1Optical disk driveTOSHIBA KK·Filed 2000·Granted Oct 14, 2003·5 cites·14 claims
- 0851US5905699AFocusing apparatus and optical disk apparatus using the sameTOSHIBA KK·Filed 1997·Granted May 18, 1999·10 cites·27 claims
- 0950US4988197AMethod and apparatus for aligning two objects, and method and apparatus for providing a desired gap between two objectsTOSHIBA KK·Filed 1988·Granted Jan 29, 1991·8 cites·139 claims
- 1039US2003002423A1Information medium with multi-layered structure, and apparatus and method using this mediumFiled 2002·Application pending·0 cites
- 1132US5299251AExposure apparatusTOSHIBA KK·Filed 1993·Granted Mar 29, 1994·2 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →