Inventor · disambiguated record
Yoshitaka Iwaki
Also filed as: IWAKI Yoshitaka
5 granted patents·3 citations·filing 2017–2021
65Inventor score
Files withHAMAMATSU PHOTONICS KK5
Top patents by PatentIndex Score
5 records- 0180US11573251B2Semiconductor sample inspection device and inspection methodHAMAMATSU PHOTONICS KK·Filed 2019·Granted Feb 7, 2023·2 cites·12 claims
- 0269US10983162B2Semiconductor device inspection method and semiconductor device inspection deviceHAMAMATSU PHOTONICS KK·Filed 2017·Granted Apr 20, 2021·1 cites·15 claims
- 0365US11714120B2Semiconductor inspection deviceHAMAMATSU PHOTONICS KK·Filed 2021·Granted Aug 1, 2023·0 cites·12 claims
- 0457US11967061B2Semiconductor apparatus examination method and semiconductor apparatus examination apparatusHAMAMATSU PHOTONICS KK·Filed 2020·Granted Apr 23, 2024·0 cites·18 claims
- 0552US11209476B2Semiconductor inspection deviceHAMAMATSU PHOTONICS KK·Filed 2018·Granted Dec 28, 2021·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →