Inventor · disambiguated record
Yong-Deok Jeong
Also filed as: JEONG YONG D · JEONG YONG-DEOK
5 granted patents·2 pending applications·8 citations·filing 2004–2015
68Inventor score
Top patents by PatentIndex Score
7 records- 0170US9267903B2Methods and apparatuses for inspecting semiconductor devices using electron beamsPARK MIRA·Filed 2013·Granted Feb 23, 2016·4 cites·24 claims
- 0263US8759763B2Method and apparatus to measure step height of device using scanning electron microscopeSAMSUNG ELECTRONICS CO LTD·Filed 2012·Granted Jun 24, 2014·1 cites·19 claims
- 0351US7034989B2Optical wavelength conversion apparatus and method using injection locking of fabry-perot laser diodeSAMSUNG ELECTRONICS CO LTD·Filed 2004·Granted Apr 25, 2006·3 cites·8 claims
- 0443US9194816B2Method of detecting a defect of a substrate and apparatus for performing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Nov 24, 2015·0 cites·7 claims
- 0537US9897552B2Optical transformation module and optical measurement system, and method of manufacturing a semiconductor device using optical transformation module and optical measurement systemSAMSUNG ELECTRONICS CO LTD·Filed 2015·Granted Feb 20, 2018·0 cites·8 claims
- 0632US2016084901A1Apparatus of inspecting resistive defects of semiconductor devices and inspecting method using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2015·Application pending·0 cites
- 0726US2008144680A1Single Mode Light Source Device Having External CavityJEONG YONG D·Filed 2005·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Yong-Deok Jeong files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →