Inventor · disambiguated record
Yoshihiro Kanetani
Also filed as: KANETANI YOSHIHIRO
4 granted patents·2 pending applications·14 citations·filing 2007–2019
65Inventor score
Top patents by PatentIndex Score
6 records- 0184US7782451B2Device for and method of inspecting surface condition having different curvaturesOMRON TATEISI ELECTRONICS CO·Filed 2007·Granted Aug 24, 2010·11 cites·6 claims
- 0264US8917900B2Measurement apparatusKANETANI YOSHIHIRO·Filed 2010·Granted Dec 23, 2014·3 cites·9 claims
- 0351US10495448B2Displacement measuring device, measuring system and displacement measuring methodOMRON TATEISI ELECTRONICS CO·Filed 2018·Granted Dec 3, 2019·0 cites·19 claims
- 0444US10514294B2Optical measurement apparatus having a synchronizing function of synchronizing time between a master device and a slave device, and connectable to an industrial networkOMRON TATEISI ELECTRONICS CO·Filed 2017·Granted Dec 24, 2019·0 cites·6 claims
- 0541US2022075062A1Optical measurement device and optical measurement methodOMRON TATEISI ELECTRONICS CO·Filed 2019·Application pending·0 cites
- 0637US2007211242A1Defect inspection apparatus and defect inspection methodOMRON TATEISI ELECTRONICS CO·Filed 2007·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Yoshihiro Kanetani files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →