Inventor · disambiguated record
Yoshio Kirino
Also filed as: KIRINO YOSHIO
2 granted patents·77 citations·filing 1990–1998
67Inventor score
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2 records- 0170US5966625AMethod for making a slant-surface silicon wafer having a reconstructed atomic-level stepped surface structureTOSHIBA CERAMICS CO·Filed 1998·Granted Oct 12, 1999·42 cites·4 claims
- 0268US5047713AMethod and apparatus for measuring a deep impurity level of a semiconductor crystalSEMITEX CO LTD·Filed 1990·Granted Sep 10, 1991·35 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →