Inventor · disambiguated record
Yoshihiro Kusuyama
Also filed as: KUSUYAMA YOSHIHIRO
28 granted patents·884 citations·filing 1999–2014
97Inventor score
Top patents by PatentIndex Score
28 records- 0198US6657260B2Thin film transistors having source wiring and terminal portion made of the same material as the gate electrodesSEMICONDUCTOR ENERGY LAB·Filed 2002·Granted Dec 2, 2003·159 cites·29 claims
- 0298US6475836B1Semiconductor device and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2000·Granted Nov 5, 2002·213 cites·35 claims
- 0396US7714329B2Semiconductor device having thin film transistorSEMICONDUCTOR ENERGY LAB·Filed 2008·Granted May 11, 2010·33 cites·29 claims
- 0496US7420209B2Semiconductor deviceSEMICONDUCTOR ENERGY LAB·Filed 2005·Granted Sep 2, 2008·31 cites·21 claims
- 0596US7071037B2Semiconductor device and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2002·Granted Jul 4, 2006·93 cites·21 claims
- 0696US6900462B2Semiconductor device and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2003·Granted May 31, 2005·70 cites·26 claims
- 0795US7875886B2Semiconductor device having a thin film transistorSEMICONDUCTOR ENERGY LAB·Filed 2010·Granted Jan 25, 2011·15 cites·30 claims
- 0894US8053339B2Semiconductor device and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2008·Granted Nov 8, 2011·16 cites·32 claims
- 0993US8093591B2Semiconductor device and manufacturing method thereofSUZAWA HIDEOMI·Filed 2009·Granted Jan 10, 2012·13 cites·26 claims
- 1092US7633085B2Semiconductor device and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2005·Granted Dec 15, 2009·14 cites·21 claims
- 1191US8735889B2Semiconductor device and manufacturing method thereofYAMAZAKI SHUNPEI·Filed 2011·Granted May 27, 2014·7 cites·20 claims
- 1291US6984550B2Semiconductor device and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2003·Granted Jan 10, 2006·34 cites·6 claims
- 1390US8053781B2Semiconductor device having thin film transistorSEMICONDUCTOR ENERGY LAB·Filed 2011·Granted Nov 8, 2011·8 cites·30 claims
- 1490US7804142B2Semiconductor device and fabrication method thereofSEMICONDUCTOR ENERGY LAB·Filed 2007·Granted Sep 28, 2010·9 cites·8 claims
- 1590US6686228B2Semiconductor device and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2002·Granted Feb 3, 2004·34 cites·24 claims
- 1689US9330940B2Semiconductor device and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted May 3, 2016·5 cites·39 claims
- 1789US7238600B2Semiconductor device and fabrication method thereofSEMICONDUCTOR ENERGY LAB·Filed 2002·Granted Jul 3, 2007·28 cites·18 claims
- 1888US7884369B2Wiring and method of manufacturing the same, and wiring board and method of manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2006·Granted Feb 8, 2011·14 cites·55 claims
- 1987US7164171B2Semiconductor device and fabrication method thereofSEMICONDUCTOR ENERGY LAB·Filed 2003·Granted Jan 16, 2007·22 cites·12 claims
- 2086US8461596B2Semiconductor device including semiconductor film with outer end having tapered shapeSUZAWA HIDEOMI·Filed 2011·Granted Jun 11, 2013·5 cites·20 claims
- 2186US7405115B2Semiconductor device and manufacturing method thereofSEMICONDUCTOR ENERGY LAB·Filed 2004·Granted Jul 29, 2008·21 cites·21 claims
- 2285US7169710B2Wiring and method of manufacturing the same, and wiring board and method of manufacturing the sameSEMICONDUCTOR ENERGY LAB·Filed 2002·Granted Jan 30, 2007·35 cites·22 claims
- 2380US8921169B2Semiconductor device and fabrication method thereofSEMICONDUCTOR ENERGY LAB·Filed 2013·Granted Dec 30, 2014·2 cites·20 claims
- 2465US9142574B2Semiconductor device and fabrication method thereofSEMICONDUCTOR ENERGY LAB·Filed 2014·Granted Sep 22, 2015·0 cites·20 claims
- 2559US8440484B2Semiconductor device and fabrication method thereofYAMAZAKI SHUNPEI·Filed 2012·Granted May 14, 2013·0 cites·20 claims
- 2657US8207536B2Semiconductor device and fabrication method thereofYAMAZAKI SHUNPEI·Filed 2011·Granted Jun 26, 2012·0 cites·7 claims
- 2756US7952152B2Semiconductor device and fabrication method thereofSEMICONDUCTOR ENERGY LAB·Filed 2010·Granted May 31, 2011·0 cites·7 claims
- 2833US6372523B1Etching method and etching deviceSEMICONDUCTOR ENERGY LAB·Filed 1999·Granted Apr 16, 2002·3 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →