Inventor · disambiguated record
Young Jung Lee
Also filed as: LEE YOUNG JUNG
8 granted patents·1 pending application·7 citations·filing 2016–2020
78Inventor score
Files withSK SILTRON CO LTD3SUNEDISON SEMICONDUCTOR LTD UEN201334164H3GLOBALWAFERS CO LTD2SUNEDISON SEMICONDUCTOR LTD1
Top patents by PatentIndex Score
9 records- 0187US11085126B2Systems for selectively feeding chunk polysilicon or granular polysilicon in a crystal growth chamberGLOBALWAFERS CO LTD·Filed 2019·Granted Aug 10, 2021·1 cites·8 claims
- 0284US10577717B2Systems for selectively feeding chunk polysilicon or granular polysilicon in a crystal growth chamberGLOBALWAFERS CO LTD·Filed 2019·Granted Mar 3, 2020·4 cites·7 claims
- 0371US10453703B2Method of treating silicon wafers to have intrinsic gettering and gate oxide integrity yieldSUNEDISON SEMICONDUCTOR LTD UEN201334164H·Filed 2017·Granted Oct 22, 2019·1 cites·15 claims
- 0467US10273596B2Systems for selectively feeding chunk polysilicon or granular polysilicon in a crystal growth chamberSUNEDISON SEMICONDUCTOR LTD·Filed 2016·Granted Apr 30, 2019·1 cites·20 claims
- 0556US11608567B2Crucible for ingot growerSK SILTRON CO LTD·Filed 2020·Granted Mar 21, 2023·0 cites·7 claims
- 0655US10707093B2Method of treating silicon wafers to have intrinsic gettering and gate oxide integrity yieldSUNEDISON SEMICONDUCTOR LTD UEN201334164H·Filed 2019·Granted Jul 7, 2020·0 cites·10 claims
- 0745US2018030615A1Methods for producing single crystal silicon ingots with reduced seed end oxygenSUNEDISON SEMICONDUCTOR LTD (UEN201334164H)·Filed 2017·Application pending·0 cites
- 0838US12060649B2Raw material supply unit, single-crystal silicon ingot growing apparatus comprising same and raw material supply methodSK SILTRON CO LTD·Filed 2020·Granted Aug 13, 2024·0 cites·5 claims
- 0929US12173426B2Raw material supply unit, and apparatus comprising same for growing single-crystal silicon ingotSK SILTRON CO LTD·Filed 2020·Granted Dec 24, 2024·0 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →