Inventor · disambiguated record
Young-Kyu Lim
Also filed as: LIM YOUNG-KYU
4 granted patents·6 pending applications·12 citations·filing 1996–2019
65Inventor score
Top patents by PatentIndex Score
10 records- 0170US7339663B2Method and apparatus for classifying repetitive defects on a substrateSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Mar 4, 2008·5 cites·25 claims
- 0243US11244921B2Semiconductor packageSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Feb 8, 2022·0 cites·20 claims
- 0343US2015053456A1Printed circuit board and manufacturing method thereofSAMSUNG ELECTRO MECH·Filed 2013·Application pending·0 cites
- 0440US2008257742A1Method of manufacturing printed circuit board for semiconductor packageSAMSUNG ELECTRO MECH·Filed 2008·Application pending·0 cites
- 0539US2008205746A1Method of inspecting an identification mark, method of inspecting a wafer using the same, and apparatus for performing the methodSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
- 0637US2006013092A1Method and apparatus for aligning a substrate, method and apparatus for inspecting a defect on a substrate using the aligning method and apparatusLEE SUNG-MAN·Filed 2005·Application pending·0 cites
- 0736US11171107B2Semiconductor packageSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Nov 9, 2021·0 cites·19 claims
- 0835US2008037857A1Method of classifying directional defects on an object and apparatus for performing the sameLIM YOUNG-KYU·Filed 2007·Application pending·0 cites
- 0934US2007031982A1Method of classifying defects and apparatus for performing the methodLIM YOUNG-KYU·Filed 2006·Application pending·0 cites
- 1032US6111637AApparatus and method for examining wafersSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Aug 29, 2000·7 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →