Inventor · disambiguated record
Youling Lin
Also filed as: LIN YOULING
19 granted patents·1,757 citations·filing 1994–2004
97Inventor score
Top patents by PatentIndex Score
19 records- 0195US6483938B1System and method for classifying an anomalyTEXAS INSTRUMENTS INC·Filed 2000·Granted Nov 19, 2002·176 cites·9 claims
- 0294US6205239B1System and method for circuit repairTEXAS INSTRUMENTS INC·Filed 1997·Granted Mar 20, 2001·230 cites·12 claims
- 0394US6091846AMethod and system for anomaly detectionTEXAS INSTRUMENTS INC·Filed 1997·Granted Jul 18, 2000·250 cites·14 claims
- 0493US6292582B1Method and system for identifying defects in a semiconductorFiled 1997·Granted Sep 18, 2001·239 cites·13 claims
- 0593US6246787B1System and method for knowledgebase generation and managementTEXAS INSTRUMENTS INC·Filed 1997·Granted Jun 12, 2001·190 cites·9 claims
- 0687US5696835AApparatus and method for aligning and measuring misregistrationTEXAS INSTRUMENTS INC·Filed 1996·Granted Dec 9, 1997·107 cites·3 claims
- 0784US6014461AApparatus and method for automatic knowlege-based object identificationTEXAS INSTRUMENTS INC·Filed 1997·Granted Jan 11, 2000·164 cites·19 claims
- 0883US6847443B1System and method for multi-wavelength, narrow-bandwidth detection of surface defectsRUDOLPH TECHNOLOGIES INC·Filed 2002·Granted Jan 25, 2005·30 cites·6 claims
- 0976US7206442B1Optical inspection method utilizing ultraviolet lightRUDOLPH TECHNOLOGIES INC·Filed 2002·Granted Apr 17, 2007·17 cites·16 claims
- 1076US5515453AApparatus and method for image processing in symbolic spaceBEACON SYS INC·Filed 1994·Granted May 7, 1996·94 cites·15 claims
- 1174US6246788B1System and method of optically inspecting manufactured devicesISOA INC·Filed 1998·Granted Jun 12, 2001·49 cites·33 claims
- 1273US6864971B2System and method for performing optical inspection utilizing diffracted lightISOA INC·Filed 2002·Granted Mar 8, 2005·13 cites·22 claims
- 1373US6292260B1System and method of optically inspecting surface structures on an objectISOA INC·Filed 1999·Granted Sep 18, 2001·49 cites·15 claims
- 1471US6487307B1System and method of optically inspecting structures on an objectISOA INC·Filed 1999·Granted Nov 26, 2002·64 cites·19 claims
- 1556US5703969ASystem and method for recognizing visual indiciaTEXAS INSTRUMENTS INC·Filed 1996·Granted Dec 30, 1997·39 cites·9 claims
- 1655US6813376B1System and method for detecting defects on a structure-bearing surface using optical inspectionRUDOLPH TECHNOLOGIES INC·Filed 2000·Granted Nov 2, 2004·8 cites·3 claims
- 1749US7359577B2Differential method for layer-to-layer registrationWANG YAN·Filed 2004·Granted Apr 15, 2008·2 cites·6 claims
- 1847US7039228B1System and method for three-dimensional surface inspectionRUDOLPH TECHNOLOGIES INC·Filed 1999·Granted May 2, 2006·28 cites·6 claims
- 1935US5553168ASystem and method for recognizing visual indiciaTEXAS INSTRUMENTS INC·Filed 1994·Granted Sep 3, 1996·8 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →