Inventor · disambiguated record
Yong Han Frankie Low
Also filed as: LOW YONG H F · LOW YONG HAN F · LOW YONG HAN FRANKIE
1 granted patent·2 pending applications·7 citations·filing 2006–2007
29Inventor score
Top patents by PatentIndex Score
3 records- 0161US7394280B1Method of electro migration testingSYSTEMS ON SILICON MFG CO PTE·Filed 2007·Granted Jul 1, 2008·7 cites·8 claims
- 0226US2008016486A1System and method of assessing reliability of a semiconductorCHAN YUEN L·Filed 2006·Application pending·0 cites
- 0325US2007185683A1Method and system for deriving time-dependent dielectric breakdown lifetimeFOO EU G G·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →