Inventor · disambiguated record
Yohji Mashiko
Also filed as: MASHIKO YOHJI
2 granted patents·115 citations·filing 1996–1998
68Inventor score
Technology areasH10P
Files withMITSUBISHI ELECTRIC CORP2
Top patents by PatentIndex Score
2 records- 0180US5844850AApparatus for analyzing a failure in a semiconductor wafer and method thereofMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Dec 1, 1998·70 cites·8 claims
- 0271US6009545ASystem for analyzing a failure in a semiconductor wafer by calculating correlation coefficient between collated data of defects per prescribed unit and failures per prescribed unitMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Dec 28, 1999·45 cites·9 claims
Join the waitlist — get patent alerts
Get an alert when Yohji Mashiko files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →