Inventor · disambiguated record
Yoshinori Mekata
Also filed as: MEKATA YOSHINORI
2 granted patents·1 pending application·9 citations·filing 2004–2007
53Inventor score
Top patents by PatentIndex Score
3 records- 0161US7508229B2Method and device for testing array substrateIBM·Filed 2005·Granted Mar 24, 2009·1 cites·10 claims
- 0255US7282943B2Inspection device for inspecting TFTIBM·Filed 2004·Granted Oct 16, 2007·8 cites·9 claims
- 0341US2008164902A1Inspection device for inspecting tftSAKAGUCHI YOSHITAMI·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →