Inventor · disambiguated record
Yoshiyuki Momiyama
Also filed as: MOMIYAMA YOSHIYUKI
2 granted patents·2 pending applications·7 citations·filing 2004–2012
52Inventor score
Top patents by PatentIndex Score
4 records- 0155US7421110B2Image processing unit for wafer inspection toolHITACHI HIGH TECH CORP·Filed 2004·Granted Sep 2, 2008·6 cites·8 claims
- 0253US7889911B2Image processing unit for wafer inspection toolHITACHI HIGH TECH CORP·Filed 2008·Granted Feb 15, 2011·1 cites·8 claims
- 0339US2013100441A1Optical inspection apparatus and edge inspection deviceHITACHI HIGH TECH CORP·Filed 2012·Application pending·0 cites
- 0428US2013136334A1Semiconductor Inspecting ApparatusSAKURAI YUICHI·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →