Inventor · disambiguated record
Young June Nam
Also filed as: NAM YOUNG JUNE
2 granted patents·31 citations·filing 1999–2000
61Inventor score
Files withHYUNDAI ELECTRONICS IND2
Top patents by PatentIndex Score
2 records- 0154US6169694B1Circuit and method for fully on-chip wafer level burn-in testHYUNDAI ELECTRONICS IND·Filed 1999·Granted Jan 2, 2001·20 cites·14 claims
- 0252US6310823B1Circuit for generating internal column strobe signal in synchronous semiconductor memory deviceHYUNDAI ELECTRONICS IND·Filed 2000·Granted Oct 30, 2001·11 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →