Inventor · disambiguated record

Young-Dong Nam

Also filed as: NAM YOUNG-DONG

2 granted patents·11 citations·filing 2003–2006

55Inventor score

Technology areasB62B G01R

Files withSAMSUNG ELECTRONICS CO LTD2

Top patents by PatentIndex Score

2 records

0160US7479793B2Apparatus for testing semiconductor test system and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Jan 20, 2009·5 cites·4 claims
0245US7424406B2Filter characteristic measuring method and systemSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Sep 9, 2008·6 cites·1 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →