Inventor · disambiguated record
Yoichiro Neo
Also filed as: NEO YOICHIRO
6 granted patents·47 citations·filing 2001–2010
79Inventor score
Top patents by PatentIndex Score
6 records- 0188US6586952B2Method of inspecting pattern and inspecting instrumentFiled 2001·Granted Jul 1, 2003·28 cites·8 claims
- 0269US6859060B2Inspection method of semiconductor device and inspection systemHITACHI LTD·Filed 2002·Granted Feb 22, 2005·14 cites·13 claims
- 0367US6924482B2Method of inspecting pattern and inspecting instrumentHITACHI LTD·Filed 2003·Granted Aug 2, 2005·5 cites·10 claims
- 0459US7876113B2Method of inspecting pattern and inspecting instrumentHITACHI LTD·Filed 2008·Granted Jan 25, 2011·0 cites·14 claims
- 0557US8405294B2Field emission electron sourceMATSUMOTO TAKAHIRO·Filed 2008·Granted Mar 26, 2013·0 cites·5 claims
- 0632US9024544B2Field emission deviceNAGAO MASAYOSHI·Filed 2010·Granted May 5, 2015·0 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →