Inventor · disambiguated record
Yoichi Nomura
Also filed as: NOMURA YOICHI
9 granted patents·3 pending applications·123 citations·filing 1985–2020
86Inventor score
Top patents by PatentIndex Score
12 records- 0182US6446351B1Linear measuring machineMITUTOYO CORP·Filed 2000·Granted Sep 10, 2002·38 cites·3 claims
- 0261US4922911AElectrodeNITTO DENKO CORP·Filed 1989·Granted May 8, 1990·31 cites·6 claims
- 0357US4602640ABiomedical electrodeNITTO ELECTRIC IND CO·Filed 1985·Granted Jul 29, 1986·15 cites·13 claims
- 0452US7251580B2Method for measuring curved surface of workpiece, program and medium thereofMITUTOYO CORP·Filed 2004·Granted Jul 31, 2007·6 cites·17 claims
- 0548US9557539B2Fixed focal-length lens systemRICOH IMAGING CO LTD·Filed 2014·Granted Jan 31, 2017·0 cites·15 claims
- 0647US4679563ABiomedical electrodeNITTO ELECTRIC IND CO·Filed 1986·Granted Jul 14, 1987·33 cites·9 claims
- 0746US10095011B2Zoom lens systemRICOH IMAGING CO LTD·Filed 2017·Granted Oct 9, 2018·0 cites·17 claims
- 0844US2008220379A1Pattern forming method and pattern formation apparatusELPIDA MEMORY INC·Filed 2008·Application pending·0 cites
- 0944US2008166664A1Method for forming a resist pattern using a shrinking technologyELPIDA MEMORY INC·Filed 2008·Application pending·0 cites
- 1040US11402608B2Imaging lens systemRICOH CO LTD·Filed 2020·Granted Aug 2, 2022·0 cites·20 claims
- 1140US8970968B2Photographing lens systemNOMURA YOICHI·Filed 2012·Granted Mar 3, 2015·0 cites·10 claims
- 1234US2007068451A1Method for forming a resist patternNOMURA YOICHI·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →