Inventor · disambiguated record
Yoichi Ohshima
Also filed as: OHSHIMA YOICHI
10 granted patents·251 citations·filing 1990–2016
91Inventor score
Top patents by PatentIndex Score
10 records- 0180US9715381B2Information processing apparatus, information processing system, information processing method, and non-transitory computer-readable storage medium having stored therein an information processing programNINTENDO CO LTD·Filed 2016·Granted Jul 25, 2017·3 cites·19 claims
- 0280US5019527AMethod of manufacturing non-volatile semiconductor memories, in which selective removal of field oxidation film for forming source region and self-adjusted treatment for forming contact portion are simultaneously performedTOSHIBA KK·Filed 1990·Granted May 28, 1991·52 cites·12 claims
- 0379US5365112ASemiconductor integrated circuit device having an improved bonding pad structureTOSHIBA KK·Filed 1992·Granted Nov 15, 1994·68 cites·23 claims
- 0478US9361091B2Information processing apparatus, information processing system, information processing method, and non-transitory computer-readable storage medium having stored therein an information processing programNINTENDO CO LTD·Filed 2014·Granted Jun 7, 2016·4 cites·19 claims
- 0567US5763321AMethod of manufacturing semiconductor device utilizing selective CVD methodTOSHIBA KK·Filed 1995·Granted Jun 9, 1998·31 cites·34 claims
- 0666US5194929ANonvolatile semiconductor memory and a memory of manufacturing the sameTOSHIBA KK·Filed 1992·Granted Mar 16, 1993·28 cites·3 claims
- 0764US5547884AMethod of manufacturing a semiconductor memory device having a common source regionTOSHIBA KK·Filed 1994·Granted Aug 20, 1996·21 cites·11 claims
- 0859US5920528AOptical disc apparatus and method of tracking control of optical disc apparatusSONY CORP·Filed 1997·Granted Jul 6, 1999·14 cites·8 claims
- 0953US5476814AMethod of manufacturing semiconductor device utilizing selective CVD methodTOSHIBA KK·Filed 1994·Granted Dec 19, 1995·19 cites·34 claims
- 1045US5394001ANonvolatile semiconductor memory device having reduced resistance value for the common source wiring regionTOSHIBA KK·Filed 1993·Granted Feb 28, 1995·11 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →