Inventor · disambiguated record
Yosuke Okamoto
Also filed as: OKAMOTO YOSUKE
20 granted patents·7 pending applications·65 citations·filing 2005–2020
92Inventor score
Top patents by PatentIndex Score
27 records- 0190US7953263B2X-ray CT apparatus and image processing apparatusTOSHIBA KK·Filed 2007·Granted May 31, 2011·23 cites·22 claims
- 0285US7538448B2Power supply circuit structure comprising a current sensor, and method of assembling the sameSUMITOMO WIRING SYSTEMS·Filed 2007·Granted May 26, 2009·6 cites·7 claims
- 0382US9244365B2Method for measuring pattern misalignmentTOSHIBA KK·Filed 2013·Granted Jan 26, 2016·4 cites·16 claims
- 0479US8914766B2Dose-data generating apparatusTOSHIBA KK·Filed 2013·Granted Dec 16, 2014·3 cites·8 claims
- 0576US9784573B2Positional deviation measuring device, non-transitory computer-readable recording medium containing a positional deviation measuring program, and method of manufacturing semiconductor deviceTOSHIBA MEMORY CORP·Filed 2015·Granted Oct 10, 2017·2 cites·6 claims
- 0670US8976356B2Measurement mark, method for measurement, and measurement apparatusTOSHIBA KK·Filed 2013·Granted Mar 10, 2015·2 cites·15 claims
- 0769US8859167B2Pattern forming method, positional deviation measuring method and photomaskHAGIO YOSHINORI·Filed 2012·Granted Oct 14, 2014·2 cites·5 claims
- 0869US8790851B2Mask and method for fabricating semiconductor deviceOKAMOTO YOSUKE·Filed 2012·Granted Jul 29, 2014·2 cites·13 claims
- 0969US8320658B2Unevenness inspection method, method for manufacturing display panel, and unevenness inspection apparatusTANIZAKI HIROYUKI·Filed 2007·Granted Nov 27, 2012·9 cites·8 claims
- 1068US9952505B2Imprint device and pattern forming methodTOSHIBA MEMORY CORP·Filed 2014·Granted Apr 24, 2018·1 cites·7 claims
- 1168US8778570B2Photomask and method for manufacturing the sameOKUDA KENTARO·Filed 2012·Granted Jul 15, 2014·2 cites·11 claims
- 1267US7609803B2Method for estimating scattered ray intensity in X-ray CT and X-ray CT apparatusTOSHIBA KK·Filed 2008·Granted Oct 27, 2009·5 cites·20 claims
- 1365US8832607B2Method for making correction map of dose amount, exposure method, and method for manufacturing semiconductor deviceKOIKE TAKASHI·Filed 2012·Granted Sep 9, 2014·1 cites·15 claims
- 1460US12243237B2Pattern-edge detection method, pattern-edge detection apparatus, and storage medium storing program for causing a computer to perform pattern-edge detectionTASMIT INC·Filed 2020·Granted Mar 4, 2025·0 cites·30 claims
- 1557US7457741B2Device for transmitting speech informationAIST·Filed 2005·Granted Nov 25, 2008·3 cites·10 claims
- 1650US2016330815A1Illumination method, and illumination deviceNAT INST ADVANCED IND SCIENCE & TECH·Filed 2014·Application pending·0 cites
- 1749US10599056B1Position measuring method, position measuring apparatus, and semiconductor device manufacturing methodTOSHIBA MEMORY CORP·Filed 2019·Granted Mar 24, 2020·0 cites·20 claims
- 1849US9146458B2EUV maskTOSHIBA KK·Filed 2013·Granted Sep 29, 2015·0 cites·5 claims
- 1947US8504951B2Dose-data generating apparatus, dose-data generating method, and manufacturing method of semiconductor deviceOKAMOTO YOSUKE·Filed 2011·Granted Aug 6, 2013·0 cites·8 claims
- 2045US2014349219A1Exposure method, reflection type mask, and semiconductor device manufacturing methodTOSHIBA KK·Filed 2013·Application pending·0 cites
- 2145US2015009488A1Mask distortion measuring apparatus and method of measuring mask distortionTOSHIBA KK·Filed 2014·Application pending·0 cites
- 2242US2014240892A1Electrostatic chuck, reticle, and electrostatic chuck methodTOSHIBA KK·Filed 2013·Application pending·0 cites
- 2340US2014285787A1Exposure system and exposure methodTOSHIBA KK·Filed 2013·Application pending·0 cites
- 2438US8953163B2Exposure apparatus, exposure method, and method of manufacturing semiconductor deviceTOSHIBA KK·Filed 2013·Granted Feb 10, 2015·0 cites·20 claims
- 2537US9941177B2Pattern accuracy detecting apparatus and processing systemTOSHIBA MEMORY CORP·Filed 2016·Granted Apr 10, 2018·0 cites·13 claims
- 2637US2014061969A1Patterning method and templateOKAMOTO YOSUKE·Filed 2012·Application pending·0 cites
- 2733US2013148120A1Overlay measuring methodOKAMOTO YOSUKE·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →