Inventor · disambiguated record
Yohei Seki
Also filed as: SEKI YOHEI
6 granted patents·6 pending applications·15 citations·filing 2007–2022
71Inventor score
Top patents by PatentIndex Score
12 records- 0176US8494310B2Three-dimensional model search method, computer program, and three-dimensional model search systemAONO MASAKI·Filed 2007·Granted Jul 23, 2013·14 cites·8 claims
- 0266US10891426B2Editing program, editing device, and editing method for editing text and displaying the edited textFUJITSU LTD·Filed 2018·Granted Jan 12, 2021·1 cites·7 claims
- 0348US11821168B2Control device for loading machine and control method for loading machineKOMATSU MFG CO LTD·Filed 2019·Granted Nov 21, 2023·0 cites·11 claims
- 0447US11959255B2Work machine control device, excavating machine control device, and work machine control methodKOMATSU MFG CO LTD·Filed 2019·Granted Apr 16, 2024·0 cites·7 claims
- 0547US11560692B2Work machineKOMATSU MFG CO LTD·Filed 2018·Granted Jan 24, 2023·0 cites·7 claims
- 0647US2024068201A1Work machine control system and work machine control methodKOMATSU MFG CO LTD·Filed 2022·Application pending·0 cites
- 0745US2024141625A1Work machine abnormality determination system and work machine abnormality determination methodKOMATSU MFG CO LTD·Filed 2022·Application pending·0 cites
- 0841US11885096B2Loading machine control device and loading machine control methodKOMATSU MFG CO LTD·Filed 2019·Granted Jan 30, 2024·0 cites·7 claims
- 0939US2018330010A1Information processing apparatus, information processing method, and recording medium recording information processing programFUJITSU LTD·Filed 2018·Application pending·0 cites
- 1037US2020362530A1Work machine control device and work machine control methodKOMATSU MFG CO LTD·Filed 2019·Application pending·0 cites
- 1134US2017180973A1Communication device and information acquisition systemFUJITSU LTD·Filed 2016·Application pending·0 cites
- 1233US2018152830A1Information reception terminal and information distribution systemFUJITSU LTD·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →