Inventor · disambiguated record
Yoshihiro Shima
Also filed as: SHIMA YOSHIHIRO
18 granted patents·701 citations·filing 1978–2017
95Inventor score
Files withHITACHI LTD10MITSUBISHI ELECTRIC CORP3TAKIGUCHI JUNICHI3HITACHI COMP PERIPHERALS CO1YOSHIDA MITSUNOBU1
Top patents by PatentIndex Score
18 records- 0194US4334241APattern position detecting systemHITACHI LTD·Filed 1980·Granted Jun 8, 1982·110 cites·7 claims
- 0281US7106904B2Form identification methodHITACHI COMP PERIPHERALS CO·Filed 2002·Granted Sep 12, 2006·53 cites·2 claims
- 0380US6246794B1Method of reading characters and method of reading postal addressesHITACHI LTD·Filed 1996·Granted Jun 12, 2001·134 cites·13 claims
- 0477US8665263B2Aerial image generating apparatus, aerial image generating method, and storage medium having aerial image generating program stored thereinYOSHIDA MITSUNOBU·Filed 2009·Granted Mar 4, 2014·10 cites·19 claims
- 0574US8625851B2Measurement apparatus, measurement method, and feature identification apparatusTAKIGUCHI JUNICHI·Filed 2012·Granted Jan 7, 2014·4 cites·6 claims
- 0674US8571265B2Measurement apparatus, measurement method, and feature identification apparatusTAKIGUCHI JUNICHI·Filed 2012·Granted Oct 29, 2013·5 cites·9 claims
- 0774US5835922ADocument processing apparatus and method for inputting the requirements of a reader or writer and for processing documents according to the requirementsHITACHI LTD·Filed 1997·Granted Nov 10, 1998·89 cites·9 claims
- 0874US5717794ADocument recognition method and systemHITACHI LTD·Filed 1996·Granted Feb 10, 1998·111 cites·21 claims
- 0973US4288816ACompressed image producing systemHITACHI LTD·Filed 1978·Granted Sep 8, 1981·21 cites·6 claims
- 1072US4494139AAutomatic assembly systemHITACHI LTD·Filed 1982·Granted Jan 15, 1985·27 cites·34 claims
- 1170US4345312AMethod and device for inspecting the defect of a pattern represented on an articleHITACHI LTD·Filed 1980·Granted Aug 17, 1982·45 cites·15 claims
- 1269US10802152B2Positioning deviceMITSUBISHI ELECTRIC CORP·Filed 2015·Granted Oct 13, 2020·2 cites·7 claims
- 1368US8483442B2Measurement apparatus, measurement method, and feature identification apparatusTAKIGUCHI JUNICHI·Filed 2008·Granted Jul 9, 2013·5 cites·7 claims
- 1454US5768451ACharacter recognition method and apparatusHITACHI LTD·Filed 1997·Granted Jun 16, 1998·48 cites·7 claims
- 1549US10816669B2Information processing deviceMITSUBISHI ELECTRIC CORP·Filed 2017·Granted Oct 27, 2020·0 cites·8 claims
- 1649US5388167ADocument image processing system and document image processing methodHITACHI LTD·Filed 1992·Granted Feb 7, 1995·23 cites·4 claims
- 1747US4783831AMethod for producing a standard pattern for pattern matchingHITACHI LTD·Filed 1985·Granted Nov 8, 1988·14 cites·9 claims
- 1844US10598792B2Information processing device and positioning deviceMITSUBISHI ELECTRIC CORP·Filed 2015·Granted Mar 24, 2020·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →