Inventor · disambiguated record
Yoon-Jae Shin
Also filed as: SHIN YOON-JAE
47 granted patents·4 pending applications·156 citations·filing 2006–2023
97Inventor score
Top patents by PatentIndex Score
51 records- 0194US7417494B2Internal voltage generatorHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Aug 26, 2008·32 cites·28 claims
- 0293US10249367B2Semiconductor apparatus comprising a plurality of current sink unitsSK HYNIX INC·Filed 2017·Granted Apr 2, 2019·8 cites·6 claims
- 0386US9508398B1Voltage generation circuit, semiconductor memory device including the same, and method for driving the sameSK HYNIX INC·Filed 2016·Granted Nov 29, 2016·5 cites·26 claims
- 0483US8210744B2Apparatus for detecting temperature using transistorsSHIN YOON-JAE·Filed 2009·Granted Jul 3, 2012·14 cites·4 claims
- 0581US8873322B2Nonvolatile memory apparatusSK HYNIX INC·Filed 2013·Granted Oct 28, 2014·7 cites·23 claims
- 0680US9437289B2Electronic deviceSK HYNIX INC·Filed 2014·Granted Sep 6, 2016·7 cites·18 claims
- 0775US10516384B2Circuit for generating voltageSK HYNIX INC·Filed 2018·Granted Dec 24, 2019·2 cites·19 claims
- 0874US9355720B2Write driver, variable resistance memory apparatus including the same, and operation methodSK HYNIX INC·Filed 2014·Granted May 31, 2016·5 cites·14 claims
- 0974US7983076B2Non-volatile semiconductor memory circuit for generating write voltageHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Jul 19, 2011·8 cites·25 claims
- 1073US8395934B2Phase-change memory deviceSHIN YOON JAE·Filed 2010·Granted Mar 12, 2013·5 cites·24 claims
- 1173US8283971B2Internal voltage generation circuit and semiconductor apparatus using the sameSHIN YOON JAE·Filed 2010·Granted Oct 9, 2012·5 cites·21 claims
- 1272US10210927B2Semiconductor apparatus comprising a plurality of current sink unitsSK HYNIX INC·Filed 2017·Granted Feb 19, 2019·2 cites·7 claims
- 1370US7599240B2Internal voltage generator of semiconductor memory deviceHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Oct 6, 2009·7 cites·18 claims
- 1468US9368236B2Semiconductor memory apparatus and test method thereofSK HYNIX INC·Filed 2014·Granted Jun 14, 2016·3 cites·18 claims
- 1568US8526226B2Current control apparatus and phase change memory having the sameLYM SANG KUG·Filed 2010·Granted Sep 3, 2013·4 cites·14 claims
- 1668US8194473B2Non-volatile semiconductor memory circuitSHIN YOON JAE·Filed 2009·Granted Jun 5, 2012·6 cites·32 claims
- 1768US7835198B2Apparatus and method for detecting leakage current of semiconductor memory device, and internal voltage generating circuit using the sameHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Nov 16, 2010·6 cites·25 claims
- 1867US9659640B2Semiconductor memory apparatus comprising a plurality of current sink unitsSK HYNIX INC·Filed 2013·Granted May 23, 2017·2 cites·21 claims
- 1967US8767451B2Internal voltage generating circuit of phase change random access memory device and method thereofSK HYNIX INC·Filed 2013·Granted Jul 1, 2014·2 cites·13 claims
- 2066US7710817B2Semiconductor memory device having a delay locked loop (DLL) and method for driving the sameHYNIX SEMICONDUCTOR INC·Filed 2007·Granted May 4, 2010·4 cites·11 claims
- 2164US7502268B2Voltage control apparatus and method of controlling voltage using the sameHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Mar 10, 2009·4 cites·24 claims
- 2263US7642837B2Internal voltage generation circuit for semiconductor device and method for generating internal voltage thereinHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Jan 5, 2010·5 cites·5 claims
- 2361US8183898B2Apparatus for supplying voltage free noise and method of operation the sameSHIN YOON-JAE·Filed 2011·Granted May 22, 2012·2 cites·27 claims
- 2460US12468477B2Semiconductor device for generating an internal voltageSK HYNIX INC·Filed 2023·Granted Nov 11, 2025·0 cites·24 claims
- 2557US8036062B2Semiconductor memory device and method for driving the sameHYNIX SEMICONDUCTOR INC·Filed 2010·Granted Oct 11, 2011·1 cites·9 claims
- 2655US8791684B2Reference voltage generatorLYM SANG KUG·Filed 2012·Granted Jul 29, 2014·1 cites·16 claims
- 2755US7661879B2Apparatus for detecting temperature using transistorsHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Feb 16, 2010·2 cites·29 claims
- 2854US12334174B2Electronic devices related to compensation of monitoring signalsSK HYNIX INC·Filed 2023·Granted Jun 17, 2025·0 cites·20 claims
- 2954US10546635B2Semiconductor apparatus capable of providing the same current to all memory elementsSK HYNIX INC·Filed 2019·Granted Jan 28, 2020·0 cites·9 claims
- 3054US7990189B2Power-up signal generating circuit and integrated circuit using the sameHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Aug 2, 2011·2 cites·9 claims
- 3153US2007200616A1Band-gap reference voltage generating circuitHYNIX SEMICONDUCTOR INC·Filed 2006·Application pending·0 cites
- 3252US8717830B2Nonvolatile semiconductor device and method for testing the sameLYM SANG KUG·Filed 2012·Granted May 6, 2014·1 cites·18 claims
- 3352US7825718B2Pumping voltage detectorHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Nov 2, 2010·1 cites·16 claims
- 3452US7816977B2Core voltage generatorHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Oct 19, 2010·2 cites·8 claims
- 3547US7791945B2Semiconductor memory device including apparatus for detecting threshold voltageHYNIX SEMICONDUCTOR INC·Filed 2007·Granted Sep 7, 2010·1 cites·20 claims
- 3646US8625380B2Internal voltage generating circuit of phase change random access memory device and method thereofSK HYNIX INC·Filed 2012·Granted Jan 7, 2014·0 cites·11 claims
- 3745US9508411B2Word line driver circuit and resistance variable memory apparatus having the sameSK HYNIX INC·Filed 2014·Granted Nov 29, 2016·0 cites·19 claims
- 3845US2010164608A1Bandgap circuit and temperature sensing circuit including the sameSHIN YOON-JAE·Filed 2009·Application pending·0 cites
- 3944US8345502B2Internal voltage generating circuit of phase change random access memory device and method thereofHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Jan 1, 2013·0 cites·11 claims
- 4044US7936635B2Semiconductor memory device and method for driving the sameHYNIX SEMICONDUCTOR INC·Filed 2010·Granted May 3, 2011·0 cites·7 claims
- 4144US7916566B2Voltage control apparatus and method of controlling voltage using the sameHYNIX SEMICONDUCTOR INC·Filed 2009·Granted Mar 29, 2011·0 cites·16 claims
- 4243US9690310B2Internal voltage generator of semiconductor device and method for driving the sameSK HYNIX INC·Filed 2016·Granted Jun 27, 2017·0 cites·7 claims
- 4342US9263125B2Nonvolatile memory apparatus, and semiconductor system and computer device using the sameSK HYNIX INC·Filed 2013·Granted Feb 16, 2016·0 cites·25 claims
- 4442US7898270B2Circuit for testing internal voltage of semiconductor memory apparatusHYNIX SEMICONDUCTOR INC·Filed 2008·Granted Mar 1, 2011·0 cites·7 claims
- 4541US8085056B2Circuit for testing internal voltage of semiconductor memory apparatusSHIN YOON JAE·Filed 2011·Granted Dec 27, 2011·0 cites·6 claims
- 4641US7999582B2Apparatus for supplying voltage free from noise and method of operation the sameHYNIX SEMICONDUCTOR INC·Filed 2006·Granted Aug 16, 2011·0 cites·21 claims
- 4739US9542124B2Electronic device and method for operating the sameSK HYNIX INC·Filed 2014·Granted Jan 10, 2017·0 cites·25 claims
- 4838US8345495B2Test circuit, nonvolatile semiconductor memory appratus using the same, and test methodSK HYNIX INC·Filed 2010·Granted Jan 1, 2013·0 cites·15 claims
- 4938US2007069806A1Operational amplifier and band gap reference voltage generation circuit including the sameHYNIX SEMICONDUCTOR INC·Filed 2006·Application pending·0 cites
- 5034US8879339B2Write control deviceOH BYOUNG CHAN·Filed 2012·Granted Nov 4, 2014·0 cites·19 claims
Showing the top 50 of 51 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →